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Yukiya Miura
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Hino-shi, JP
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last 30 patents
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Patent Grant
Semiconductor device, detection method and program
Patent number
9,316,684
Issue date
Apr 19, 2016
Kyushu Institute of Technology
Yasuo Sato
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
SEMICONDUCTOR DEVICE, DETECTION METHOD AND PROGRAM
Publication number
20130013247
Publication date
Jan 10, 2013
Kyushu Institute of Technology
Yasuo Sato
G01 - MEASURING TESTING