Yuko Ito

Person

Akishima, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor integrated circuit
- Patent number 9,291,671
- Issue date Mar 22, 2016
- Hitachi, Ltd.
- Yasuyoshi Sunaga
- G01 - MEASURING TESTING
Information Patent Grant
Design method of semiconductor device
- Patent number 6,760,895
- Issue date Jul 6, 2004
- Hitachi, Ltd.
- Yuko Ito
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of computing wiring capacitance, method of computing signal...
- Patent number 6,530,066
- Issue date Mar 4, 2003
- Hitachi, Ltd.
- Yuko Ito
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor integrated circuit device and method of manufacturing...
- Patent number 6,034,912
- Issue date Mar 7, 2000
- Hitachi, Ltd.
- Satoru Isomura
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor integrated circuit device with interleaved memory and...
- Patent number 5,898,636
- Issue date Apr 27, 1999
- Hitachi, Ltd.
- Satoru Isomura
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated circuit having alternate rows of logic cells and I/O cells
- Patent number 5,341,049
- Issue date Aug 23, 1994
- Hitachi, Ltd.
- Atsushi Shimizu
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Semiconductor device and semiconductor module having auxiliary high...
- Patent number 5,306,948
- Issue date Apr 26, 1994
- Hitachi, Ltd.
- Takeo Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit device having separate supply volt...
- Patent number 5,274,280
- Issue date Dec 28, 1993
- Hitachi, Ltd.
- Yuko Ito
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT
- Publication number 20140070863
- Publication date Mar 13, 2014
- Hitachi, Ltd
- Yasuyoshi Sunaga
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT
- Publication number 20110074385
- Publication date Mar 31, 2011
- Hitachi, Ltd.
- Yasuyoshi Sunaga
- G01 - MEASURING TESTING
Information Patent Application
Design method of semiconductor device
- Publication number 20030217344
- Publication date Nov 20, 2003
- Hitachi, Ltd.
- Yuko Ito
- G06 - COMPUTING CALCULATING COUNTING

Person

Patents Grantslast 30 patents

Semiconductor integrated circuit

Design method of semiconductor device

Method of computing wiring capacitance, method of computing signal...

Semiconductor integrated circuit device and method of manufacturing...

Semiconductor integrated circuit device with interleaved memory and...

Integrated circuit having alternate rows of logic cells and I/O cells

Semiconductor device and semiconductor module having auxiliary high...

Semiconductor integrated circuit device having separate supply volt...

Patents Applicationslast 30 patents

SEMICONDUCTOR INTEGRATED CIRCUIT

SEMICONDUCTOR INTEGRATED CIRCUIT

Design method of semiconductor device