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Yuko KANAZAWA

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  • Aomori, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Electrical test probe
    • Patent number 9,568,500
    • Issue date Feb 14, 2017
    • Kabushiki Kaisha Nihon Micronics
    • Hideki Hirakawa
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    ELECTRICAL TEST PROBE
    • Publication number 20130321016
    • Publication date Dec 5, 2013
    • Kabushiki Kaisha Nihon Micronics
    • Hideki HIRAKAWA
    • G01 - MEASURING TESTING