Yuko Nambu

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Shiga, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method for predicting temperature, test wafer for use in temperatur...
- Patent number 6,799,888
- Issue date Oct 5, 2004
- Matsushita Electric Industrial Co., Ltd.
- Satoshi Shibata
- G01 - MEASURING TESTING
Information Patent Grant
Method for predicting temperature, test wafer for use in temperatur...
- Patent number 6,666,577
- Issue date Dec 23, 2003
- Matsushita Electric Industrial Co., Ltd.
- Satoshi Shibata
- G01 - MEASURING TESTING
Information Patent Grant
Method for predicting temperature and test wafer for use in tempera...
- Patent number 6,616,331
- Issue date Sep 9, 2003
- Matsushita Electric Industrial Co., Ltd.
- Satoshi Shibata
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring temperature, method of taking samples for tempe...
- Patent number 6,475,815
- Issue date Nov 5, 2002
- Matsushita Electric Industrial Co., Ltd.
- Yuko Nambu
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Method for predicting temperature, test wafer for use in temperatur...
- Publication number 20040109489
- Publication date Jun 10, 2004
- Matsushita Electric Industrial Co., Ltd.
- Satoshi Shibata
- G01 - MEASURING TESTING
Information Patent Application
Method for predicting temperature, test wafer for use in temperatur...
- Publication number 20040047394
- Publication date Mar 11, 2004
- Matsushita Electric Industrial Co., Ltd.
- Satoshi Shibata
- G01 - MEASURING TESTING
Information Patent Application
Method for predicting temperature and test wafer for use in tempera...
- Publication number 20020075936
- Publication date Jun 20, 2002
- Satoshi Shibata
- G01 - MEASURING TESTING
Information Patent Application
Method for predicting temperature, test wafer for use in temperatur...
- Publication number 20020051481
- Publication date May 2, 2002
- Satoshi Shibata
- G01 - MEASURING TESTING