Yuko Okada

Follow

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Wafer inspection apparatus and wafer inspection method
- Patent number 11,342,211
- Issue date May 24, 2022
- HITACHI HIGH-TECH CORPORATION
- Akira Doi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
CNT film and field-emission cold cathode comprising the same
- Patent number 7,161,285
- Issue date Jan 9, 2007
- NEC Corporation
- Akihiko Okamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electric discharge processing method for an electron tube using a f...
- Patent number 6,380,700
- Issue date Apr 30, 2002
- NEC Corporation
- Yuko Okada
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
WAFER INSPECTION APPARATUS AND WAFER INSPECTION METHOD
- Publication number 20210118710
- Publication date Apr 22, 2021
- HITACHI HIGH-TECH CORPORATION
- Akira DOI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Cnt film and field-emission cold cathode comprising the same
- Publication number 20040104660
- Publication date Jun 3, 2004
- Akihiko Okamoto
- B82 - NANO-TECHNOLOGY
Information Patent Application
Pattern forming method for carbon nanotube, and field emission cold...
- Publication number 20040043219
- Publication date Mar 4, 2004
- Fuminori Ito
- B82 - NANO-TECHNOLOGY
Information Patent Application
Field electron emission apparatus and method for manufacturing the...
- Publication number 20040036401
- Publication date Feb 26, 2004
- Kazuo Konuma
- B82 - NANO-TECHNOLOGY