Yuko OTANI

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Defect detection device, defect detection method, and defect observ...
- Patent number 11,982,631
- Issue date May 14, 2024
- HITACHI HIGH-TECH CORPORATION
- Yuko Otani
- G01 - MEASURING TESTING
Information Patent Grant
Defect detection device, defect detection method, and defect observ...
- Patent number 11,802,841
- Issue date Oct 31, 2023
- HITACHI HIGH-TECH CORPORATION
- Yuji Takagi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect observation device
- Patent number 10,770,260
- Issue date Sep 8, 2020
- Hitachi High-Technologies Corporation
- Yuko Otani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect detection device and defect observation device
- Patent number 10,642,164
- Issue date May 5, 2020
- Hitachi High-Technologies Corporation
- Yuko Otani
- G01 - MEASURING TESTING
Information Patent Grant
Defect observation apparatus
- Patent number 10,593,062
- Issue date Mar 17, 2020
- Hitachi High-Technologies Corporation
- Yuko Otani
- G01 - MEASURING TESTING
Information Patent Grant
Defect reviewing method and device
- Patent number 10,436,576
- Issue date Oct 8, 2019
- Hitachi High-Technologies Corporation
- Yohei Minekawa
- G01 - MEASURING TESTING
Information Patent Grant
Defect observation method and device and defect detection device
- Patent number 10,401,300
- Issue date Sep 3, 2019
- Hitachi High-Technologies Corporation
- Yuko Otani
- G02 - OPTICS
Information Patent Grant
Defect detection method and defect detection device and defect obse...
- Patent number 10,267,745
- Issue date Apr 23, 2019
- Hitachi High-Technologies Corporation
- Yuko Otani
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection device and defect inspection method
- Patent number 10,228,332
- Issue date Mar 12, 2019
- Hitachi High-Technologies Corporation
- Toshifumi Honda
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for observing defects
- Patent number 9,773,641
- Issue date Sep 26, 2017
- Hitachi High-Technologies Corporation
- Yuko Otani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Defect detection method and defect detection device and defect obse...
- Patent number 9,759,666
- Issue date Sep 12, 2017
- Hitachi High-Technologies Corporation
- Yuko Otani
- G01 - MEASURING TESTING
Information Patent Grant
Method for reviewing a defect and apparatus
- Patent number 9,733,194
- Issue date Aug 15, 2017
- Hitachi High-Technologies Corporation
- Yuko Otani
- G01 - MEASURING TESTING
Information Patent Grant
Composite particles for electrochemical device electrode, material...
- Patent number 9,685,658
- Issue date Jun 20, 2017
- Zeon Corporation
- Taku Matsumura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Defect observation method and device therefor
- Patent number 9,436,990
- Issue date Sep 6, 2016
- Hitachi High-Technologies Corporation
- Yuko Otani
- G01 - MEASURING TESTING
Information Patent Grant
Defect detection method and defect detection device and defect obse...
- Patent number 9,217,718
- Issue date Dec 22, 2015
- Hitachi High-Technologies Corporation
- Yuko Otani
- G01 - MEASURING TESTING
Information Patent Grant
Defect detection method and defect detection device and defect obse...
- Patent number 8,953,156
- Issue date Feb 10, 2015
- Hitachi High-Technologies Corporation
- Yuko Otani
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Inspection Device and Inspection Method
- Publication number 20240280520
- Publication date Aug 22, 2024
- Hitachi High-Tech Corporation
- Takashi HIROI
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL FILTERING DEVICE, METHOD OF CONTROLLING OPTICAL FILTERING D...
- Publication number 20240231064
- Publication date Jul 11, 2024
- HITACHI HIGH-TECH CORPORATION
- Yasuhiro YOSHIMURA
- G02 - OPTICS
Information Patent Application
OPTICAL FILTERING DEVICE, METHOD OF CONTROLLING OPTICAL FILTERING D...
- Publication number 20240134175
- Publication date Apr 25, 2024
- HITACHI HIGH-TECH CORPORATION
- Yasuhiro YOSHIMURA
- G02 - OPTICS
Information Patent Application
Microscope System
- Publication number 20220308331
- Publication date Sep 29, 2022
- HITACHI HIGH-TECH CORPORATION
- Nobuhiko KANZAKI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT DETECTION DEVICE, DEFECT DETECTION METHOD, AND DEFECT OBSERV...
- Publication number 20220155240
- Publication date May 19, 2022
- Hitachi High-Tech Corporation
- Yuko Otani
- G02 - OPTICS
Information Patent Application
DEFECT DETECTION DEVICE, DEFECT DETECTION METHOD, AND DEFECT OBSERV...
- Publication number 20210109035
- Publication date Apr 15, 2021
- Hitachi High-Tech Corporation
- Yuji Takagi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT OBSERVATION DEVICE
- Publication number 20190237296
- Publication date Aug 1, 2019
- Hitachi High-Technologies Corporation
- Yuko OTANI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT DETECTION DEVICE AND DEFECT OBSERVATION DEVICE
- Publication number 20180088469
- Publication date Mar 29, 2018
- Hitachi High-Technologies Corporation
- Yuko OTANI
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
DEFECT DETECTION METHOD AND DEFECT DETECTION DEVICE AND DEFECT OBSE...
- Publication number 20170363547
- Publication date Dec 21, 2017
- Hitachi High-Technologies Corporation
- Yuko OTANI
- G01 - MEASURING TESTING
Information Patent Application
DEFECT OBSERVATION METHOD AND DEFECT OBSERVATION DEVICE
- Publication number 20170328842
- Publication date Nov 16, 2017
- Hitachi High-Technologies Corporation
- Yuko Otani
- G01 - MEASURING TESTING
Information Patent Application
DEFECT OBSERVATION APPARATUS
- Publication number 20170249753
- Publication date Aug 31, 2017
- Hitachi High-Technologies Corporation
- Yuko OTANI
- G02 - OPTICS
Information Patent Application
Defect Inspection Device and Defect Inspection Method
- Publication number 20170146463
- Publication date May 25, 2017
- Hitachi High-Technologies Corporation
- Toshifumi HONDA
- G01 - MEASURING TESTING
Information Patent Application
DEFECT OBSERVATION METHOD AND DEVICE AND DEFECT DETECTION DEVICE
- Publication number 20170108444
- Publication date Apr 20, 2017
- Hitachi High-Technologies Corporation
- Yuko OTANI
- G02 - OPTICS
Information Patent Application
DEFECT REVIEWING METHOD AND DEVICE
- Publication number 20170082425
- Publication date Mar 23, 2017
- Hitachi High-Technologies Corporation
- Yohei MINEKAWA
- G02 - OPTICS
Information Patent Application
Method and Apparatus for Reviewing Defects
- Publication number 20160211112
- Publication date Jul 21, 2016
- Hitachi High-Technologies Corporation
- Toshiyuki NAKAO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEFECT DETECTION METHOD AND DEFECT DETECTION DEVICE AND DEFECT OBSE...
- Publication number 20160069816
- Publication date Mar 10, 2016
- Hitachi High-Technologies Corporation
- Yuko OTANI
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR REVIEWING A DEFECT AND APPARATUS
- Publication number 20160018340
- Publication date Jan 21, 2016
- Hitachi High-Technologies Corporation
- Yuko Otani
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR DETECTING DEFECTS AND METHOD AND DEVICE FOR O...
- Publication number 20150276622
- Publication date Oct 1, 2015
- Hitachi High-Technologies Corporation
- Yuko Otani
- G01 - MEASURING TESTING
Information Patent Application
DEFECT DETECTION METHOD AND DEFECT DETECTION DEVICE AND DEFECT OBSE...
- Publication number 20150116712
- Publication date Apr 30, 2015
- Hitachi High-Technologies Corporation
- Yuko OTANI
- G01 - MEASURING TESTING
Information Patent Application
DEFECT OBSERVATION METHOD AND DEVICE THEREFOR
- Publication number 20150003722
- Publication date Jan 1, 2015
- Hitachi High-Technologies Corporation
- Yuko Otani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ELECTRODE FOR ELECTROCHEMICAL DEVICE
- Publication number 20140342225
- Publication date Nov 20, 2014
- Zeon Corporation
- Yasuhiro Isshiki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEFECT OBSERVATION METHOD AND DEVICE THEREFOR
- Publication number 20140204194
- Publication date Jul 24, 2014
- Hitachi High-Technologies Corporation
- Yuko Otani
- G02 - OPTICS
Information Patent Application
COMPOSITE PARTICLES FOR ELECTROCHEMICAL DEVICE ELECTRODE, MATERIAL...
- Publication number 20140170486
- Publication date Jun 19, 2014
- Zeon Corporation
- Taku Matsumura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR OBSERVING DEFECTS
- Publication number 20130277553
- Publication date Oct 24, 2013
- Yuko Otani
- G01 - MEASURING TESTING
Information Patent Application
DEFECT DETECTION METHOD AND DEFECT DETECTION DEVICE AND DEFECT OBSE...
- Publication number 20120274931
- Publication date Nov 1, 2012
- Yuko Otani
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Defect detection device, defect detection method, and defect observ...

Defect detection device, defect detection method, and defect observ...

Defect observation device

Defect detection device and defect observation device

Defect observation apparatus

Defect reviewing method and device

Defect observation method and device and defect detection device

Defect detection method and defect detection device and defect obse...

Defect inspection device and defect inspection method

Method and apparatus for observing defects

Defect detection method and defect detection device and defect obse...

Method for reviewing a defect and apparatus

Composite particles for electrochemical device electrode, material...

Defect observation method and device therefor

Defect detection method and defect detection device and defect obse...

Defect detection method and defect detection device and defect obse...

Patents Applicationslast 30 patents

Inspection Device and Inspection Method

OPTICAL FILTERING DEVICE, METHOD OF CONTROLLING OPTICAL FILTERING D...

OPTICAL FILTERING DEVICE, METHOD OF CONTROLLING OPTICAL FILTERING D...

Microscope System

DEFECT DETECTION DEVICE, DEFECT DETECTION METHOD, AND DEFECT OBSERV...

DEFECT DETECTION DEVICE, DEFECT DETECTION METHOD, AND DEFECT OBSERV...

DEFECT OBSERVATION DEVICE

DEFECT DETECTION DEVICE AND DEFECT OBSERVATION DEVICE

DEFECT DETECTION METHOD AND DEFECT DETECTION DEVICE AND DEFECT OBSE...

DEFECT OBSERVATION METHOD AND DEFECT OBSERVATION DEVICE

DEFECT OBSERVATION APPARATUS

Defect Inspection Device and Defect Inspection Method

DEFECT OBSERVATION METHOD AND DEVICE AND DEFECT DETECTION DEVICE

DEFECT REVIEWING METHOD AND DEVICE

Method and Apparatus for Reviewing Defects

DEFECT DETECTION METHOD AND DEFECT DETECTION DEVICE AND DEFECT OBSE...

METHOD FOR REVIEWING A DEFECT AND APPARATUS

METHOD AND DEVICE FOR DETECTING DEFECTS AND METHOD AND DEVICE FOR O...

DEFECT DETECTION METHOD AND DEFECT DETECTION DEVICE AND DEFECT OBSE...

DEFECT OBSERVATION METHOD AND DEVICE THEREFOR

ELECTRODE FOR ELECTROCHEMICAL DEVICE

DEFECT OBSERVATION METHOD AND DEVICE THEREFOR

COMPOSITE PARTICLES FOR ELECTROCHEMICAL DEVICE ELECTRODE, MATERIAL...

METHOD AND APPARATUS FOR OBSERVING DEFECTS

DEFECT DETECTION METHOD AND DEFECT DETECTION DEVICE AND DEFECT OBSE...