Yumi HAYASHI

Person

Yokohama-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Sensor and method for calibrating sensor
- Patent number 11,906,495
- Issue date Feb 20, 2024
- Kabushiki Kaisha Toshiba
- Yumi Hayashi
- G01 - MEASURING TESTING
Information Patent Grant
Sensor and method for manufacturing the same
- Patent number 11,808,726
- Issue date Nov 7, 2023
- Kabushiki Kaisha Toshiba
- Yumi Hayashi
- G01 - MEASURING TESTING
Information Patent Grant
Gas sensor
- Patent number 11,796,502
- Issue date Oct 24, 2023
- Kabushiki Kaisha Toshiba
- Yumi Hayashi
- G01 - MEASURING TESTING
Information Patent Grant
Gas sensor
- Patent number 11,598,746
- Issue date Mar 7, 2023
- Kabushiki Kaisha Toshiba
- Yumi Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sensor
- Patent number 11,493,471
- Issue date Nov 8, 2022
- Kabushiki Kaisha Toshiba
- Yumi Hayashi
- G01 - MEASURING TESTING
Information Patent Grant
Sensor and sensor module
- Patent number 11,448,628
- Issue date Sep 20, 2022
- Kabushiki Kaisha Toshiba
- Naoki Hiramatsu
- G01 - MEASURING TESTING
Information Patent Grant
Gas sensor including sensing section for sensing predetermined phys...
- Patent number 11,009,478
- Issue date May 18, 2021
- Kabushiki Kaisha Toshiba
- Yumi Hayashi
- G01 - MEASURING TESTING
Information Patent Grant
MEMS device with protective structure
- Patent number 9,568,386
- Issue date Feb 14, 2017
- Kabushiki Kaisha Toshiba
- Yumi Hayashi
- G01 - MEASURING TESTING
Information Patent Grant
MEMS device
- Patent number 9,274,017
- Issue date Mar 1, 2016
- Kabushiki Kaisha Toshiba
- Naofumi Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and method of manufacturing the same
- Patent number 8,802,576
- Issue date Aug 12, 2014
- Kabushiki Kaisha Toshiba
- Yumi Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method for manufacturing the same
- Patent number 8,704,374
- Issue date Apr 22, 2014
- Kabushiki Kaisha Toshiba
- Yumi Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for fabricating semiconductor device and semiconductor device
- Patent number 8,536,706
- Issue date Sep 17, 2013
- Kabushiki Kaisha Toshiba
- Yumi Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for fabricating semiconductor device and semiconductor device
- Patent number 8,344,509
- Issue date Jan 1, 2013
- Kabushiki Kaisha Toshiba
- Yumi Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method of manufacturing the same
- Patent number 8,338,911
- Issue date Dec 25, 2012
- Kabushiki Kaisha Toshiba
- Hiroko Miki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method for fabricating semiconductor device
- Patent number 7,936,070
- Issue date May 3, 2011
- Kabushiki Kaisha Toshiba
- Yumi Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and manufacturing method of semiconductor device
- Patent number 7,888,262
- Issue date Feb 15, 2011
- Kabushiki Kaisha Toshiba
- Yumi Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and manufacturing method of semiconductor device
- Patent number 7,847,405
- Issue date Dec 7, 2010
- Kabushiki Kaisha Toshiba
- Tadayoshi Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Capacitor of dynamic random access memory and method of manufacturi...
- Patent number 7,786,523
- Issue date Aug 31, 2010
- Kabushiki Kaisha Toshiba
- Yumi Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method of fabricating the same
- Patent number 7,755,202
- Issue date Jul 13, 2010
- Kabushiki Kaisha Toshiba
- Yumi Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Capacitor of dynamic random access memory and method of manufacturi...
- Patent number 7,638,829
- Issue date Dec 29, 2009
- Kabushiki Kaisha Toshiba
- Yumi Hayashi
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SENSOR AND SENSOR SYSTEM
- Publication number 20240201119
- Publication date Jun 20, 2024
- Kabushiki Kaisha Toshiba
- Yumi HAYASHI
- G01 - MEASURING TESTING
Information Patent Application
SENSOR
- Publication number 20240068973
- Publication date Feb 29, 2024
- Kabushiki Kaisha Toshiba
- Yumi HAYASHI
- G01 - MEASURING TESTING
Information Patent Application
SENSOR
- Publication number 20230408434
- Publication date Dec 21, 2023
- Kabushiki Kaisha Toshiba
- Yumi HAYASHI
- G01 - MEASURING TESTING
Information Patent Application
SENSOR
- Publication number 20220268723
- Publication date Aug 25, 2022
- Kabushiki Kaisha Toshiba
- Yumi HAYASHI
- G01 - MEASURING TESTING
Information Patent Application
SENSOR AND SENSOR MODULE
- Publication number 20220018820
- Publication date Jan 20, 2022
- Kabushiki Kaisha Toshiba
- Naoki HIRAMATSU
- G01 - MEASURING TESTING
Information Patent Application
SENSOR AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20220011254
- Publication date Jan 13, 2022
- Kabushiki Kaisha Toshiba
- Yumi HAYASHI
- G01 - MEASURING TESTING
Information Patent Application
GAS SENSOR
- Publication number 20210310983
- Publication date Oct 7, 2021
- Kabushiki Kaisha Toshiba
- Yumi HAYASHI
- G01 - MEASURING TESTING
Information Patent Application
SENSOR AND METHOD FOR CALIBRATING SENSOR
- Publication number 20210109071
- Publication date Apr 15, 2021
- Kabushiki Kaisha Toshiba
- Yumi HAYASHI
- G01 - MEASURING TESTING
Information Patent Application
GAS SENSOR
- Publication number 20200300803
- Publication date Sep 24, 2020
- KABUSHIKI KAISHA TOSHIBA
- Yumi Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GAS SENSOR
- Publication number 20200011828
- Publication date Jan 9, 2020
- KABUSHIKI KAISHA TOSHIBA
- Yumi HAYASHI
- G01 - MEASURING TESTING
Information Patent Application
GAS SENSOR
- Publication number 20190162694
- Publication date May 30, 2019
- Kabushiki Kaisha Toshiba
- Yumi HAYASHI
- G01 - MEASURING TESTING
Information Patent Application
SENSOR DEVICE
- Publication number 20160265996
- Publication date Sep 15, 2016
- Kabushiki Kaisha Toshiba
- Yumi HAYASHI
- G01 - MEASURING TESTING
Information Patent Application
SENSOR AND SENSOR SYSTEM
- Publication number 20160265986
- Publication date Sep 15, 2016
- Kabushiki Kaisha Toshiba
- Daiki ONO
- G01 - MEASURING TESTING
Information Patent Application
MEMS ELEMENT AND MANUFACTURING METHOD OF THE SAME
- Publication number 20160075550
- Publication date Mar 17, 2016
- Kabushiki Kaisha Toshiba
- Naofumi NAKAMURA
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
PRESSURE SENSOR AND METHOD OF MANUFACTURING THE SAME
- Publication number 20150292970
- Publication date Oct 15, 2015
- Kabushiki Kaisha Toshiba
- Ryunosuke GANDO
- G01 - MEASURING TESTING
Information Patent Application
MEMS DEVICE
- Publication number 20150253212
- Publication date Sep 10, 2015
- Kabushiki Kaisha Toshiba
- Yumi HAYASHI
- G01 - MEASURING TESTING
Information Patent Application
MEMS DEVICE
- Publication number 20150068314
- Publication date Mar 12, 2015
- Kabushiki Kaisha Toshiba
- Naofumi NAKAMURA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20140306316
- Publication date Oct 16, 2014
- KABUSHIKI KAISHA TOSHIBA
- Yumi HAYASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20130119550
- Publication date May 16, 2013
- Kabushiki Kaisha Toshiba
- Yumi HAYASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR FABRICATING SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE
- Publication number 20130093090
- Publication date Apr 18, 2013
- Yumi HAYASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20130043604
- Publication date Feb 21, 2013
- Yumi HAYASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SAME
- Publication number 20120187569
- Publication date Jul 26, 2012
- Kabushiki Kaisha Toshiba
- Yumi HAYASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20110309517
- Publication date Dec 22, 2011
- Kabushiki Kaisha Toshiba
- Hiroko Miki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD
- Publication number 20100207274
- Publication date Aug 19, 2010
- Kabushiki Kaisha Toshiba
- Yumi Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR FABRICATING SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE
- Publication number 20100181673
- Publication date Jul 22, 2010
- Kabushiki Kaisha Toshiba
- Yumi HAYASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CAPACITOR OF DYNAMIC RANDOM ACCESS MEMORY AND METHOD OF MANUFACTURI...
- Publication number 20100052028
- Publication date Mar 4, 2010
- Kabushiki Kaisha Toshiba
- Yumi Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
- Publication number 20090289366
- Publication date Nov 26, 2009
- Kabushiki Kaisha Toshiba
- Tadayoshi WATANABE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING SEMICONDUCTOR DEVICE
- Publication number 20090283913
- Publication date Nov 19, 2009
- Kabushiki Kaisha Toshiba
- Yumi HAYASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME
- Publication number 20080246155
- Publication date Oct 9, 2008
- Kabushiki Kaisha Toshiba
- Yumi Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
- Publication number 20080142989
- Publication date Jun 19, 2008
- Kabushiki Kaisha Toshiba
- Yumi Hayashi
- H01 - BASIC ELECTRIC ELEMENTS

Yumi HAYASHI

Person

Patents Grantslast 30 patents

Sensor and method for calibrating sensor

Sensor and method for manufacturing the same

Gas sensor

Gas sensor

Sensor

Sensor and sensor module

Gas sensor including sensing section for sensing predetermined phys...

MEMS device with protective structure

MEMS device

Semiconductor device and method of manufacturing the same

Semiconductor device and method for manufacturing the same

Method for fabricating semiconductor device and semiconductor device

Method for fabricating semiconductor device and semiconductor device

Semiconductor device and method of manufacturing the same

Semiconductor device and method for fabricating semiconductor device

Semiconductor device and manufacturing method of semiconductor device

Semiconductor device and manufacturing method of semiconductor device

Capacitor of dynamic random access memory and method of manufacturi...

Semiconductor device and method of fabricating the same

Capacitor of dynamic random access memory and method of manufacturi...

Patents Applicationslast 30 patents

SENSOR AND SENSOR SYSTEM

SENSOR

SENSOR

SENSOR

SENSOR AND SENSOR MODULE

SENSOR AND METHOD FOR MANUFACTURING THE SAME

GAS SENSOR

SENSOR AND METHOD FOR CALIBRATING SENSOR

GAS SENSOR

GAS SENSOR

GAS SENSOR

SENSOR DEVICE

SENSOR AND SENSOR SYSTEM

MEMS ELEMENT AND MANUFACTURING METHOD OF THE SAME

PRESSURE SENSOR AND METHOD OF MANUFACTURING THE SAME

MEMS DEVICE

MEMS DEVICE

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME

METHOD FOR FABRICATING SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SAME

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME

SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD

METHOD FOR FABRICATING SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE

CAPACITOR OF DYNAMIC RANDOM ACCESS MEMORY AND METHOD OF MANUFACTURI...

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE