Yumiko WATANABE

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Yokohama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Failure analysis system of semiconductor device, failure analysis m...
- Patent number 12,235,770
- Issue date Feb 25, 2025
- Kioxia Corporation
- Mami Kodama
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
INTERPOSER PACKAGE, MOUNTING METHOD, AND BURN-IN TEST APPARATUS
- Publication number 20250199060
- Publication date Jun 19, 2025
- KIOXIA Corporation
- Masaki YOSHIMURA
- G01 - MEASURING TESTING
Information Patent Application
FAILURE ANALYSIS SYSTEM OF SEMICONDUCTOR DEVICE, FAILURE ANALYSIS M...
- Publication number 20220066854
- Publication date Mar 3, 2022
- KIOXIA Corporation
- Mami KODAMA
- G06 - COMPUTING CALCULATING COUNTING