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Yumiko Yamashita
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Tokyo, JP
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last 30 patents
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Patent Grant
Semiconductor device having metal alloy for electrodes
Patent number
6,011,305
Issue date
Jan 4, 2000
NEC Corporation
Kouichi Suzuki
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
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Patent Grant
Test method and apparatus for semiconductor element
Patent number
5,990,698
Issue date
Nov 23, 1999
NEC Corporation
Kouichi Suzuki
G01 - MEASURING TESTING