YUN-BO YANG

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ASAN-SI, KR

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Patents Grantslast 30 patents

Information Patent Grant
Interface board, a multichip package (MCP) test system including th...
- Patent number 10,338,134
- Issue date Jul 2, 2019
- Samsung Electronics Co., Ltd.
- Min-Chul Jun
- G01 - MEASURING TESTING
Information Patent Grant
Memory card
- Patent number 9,183,950
- Issue date Nov 10, 2015
- Samsung Electronics Co., Ltd.
- Yun-Bo Yang
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and equipment for testing semiconductor apparatuses simultan...
- Patent number 9,000,789
- Issue date Apr 7, 2015
- Samsung Electronics Co., Ltd.
- Eun-sik Kim
- G01 - MEASURING TESTING
Information Patent Grant
Memory card
- Patent number 8,769,353
- Issue date Jul 1, 2014
- Samsung Electronics Co., Ltd.
- Yun-Bo Yang
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for testing standby current of semiconductor package
- Patent number 7,368,933
- Issue date May 6, 2008
- Samsung Electronics Co., Ltd.
- Moon-Bo Sim
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INTERFACE BOARD, A MULTICHIP PACKAGE (MCP) TEST SYSTEM INCLUDING TH...
- Publication number 20170139004
- Publication date May 18, 2017
- Samsung Electronics Co., Ltd.
- MIN-CHUL JUN
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND EQUIPMENT FOR TESTING SEMICONDUCTOR APPARATUSES SIMULTAN...
- Publication number 20150198658
- Publication date Jul 16, 2015
- Samsung Electronics Co., Ltd.
- Eun-sik Kim
- G01 - MEASURING TESTING
Information Patent Application
MEMORY CARD
- Publication number 20140281765
- Publication date Sep 18, 2014
- Yun-Bo YANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND EQUIPMENT FOR TESTING SEMICONDUCTOR APPARATUSES SIMULTAN...
- Publication number 20120146673
- Publication date Jun 14, 2012
- Eun-Sik Kim
- G01 - MEASURING TESTING
Information Patent Application
MEMORY CARD
- Publication number 20120117430
- Publication date May 10, 2012
- Yun-Bo YANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for testing standby current of semiconductor package
- Publication number 20060158205
- Publication date Jul 20, 2006
- Moon-Bo Sim
- G01 - MEASURING TESTING