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Patents Grantslast 30 patents

Information Patent Grant
Module substrate for semiconductor module, semiconductor module and...
- Patent number 12,130,306
- Issue date Oct 29, 2024
- Samsung Electronics Co., Ltd.
- Kwangkyu Bang
- G01 - MEASURING TESTING
Information Patent Grant
Test socket for performing a test on an electronic device
- Patent number 12,038,473
- Issue date Jul 16, 2024
- Samsung Electronics Co., Ltd.
- Kiljoong Yun
- G01 - MEASURING TESTING
Information Patent Grant
Storage device testing module
- Patent number 12,019,485
- Issue date Jun 25, 2024
- Samsung Electronics Co., Ltd.
- Yun Chang
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
MODULE SUBSTRATE FOR SEMICONDUCTOR MODULE, SEMICONDUCTOR MODULE AND...
- Publication number 20230213554
- Publication date Jul 6, 2023
- Samsung Electronics Co., Ltd.
- Kwangkyu Bang
- G01 - MEASURING TESTING
Information Patent Application
TEST SOCKET FOR PERFORMING A TEST ON AN ELECTRONIC DEVICE
- Publication number 20230098635
- Publication date Mar 30, 2023
- Samsung Electronics Co., Ltd.
- Kiljoong YUN
- G01 - MEASURING TESTING
Information Patent Application
STORAGE DEVICE TESTING MODULE
- Publication number 20230087045
- Publication date Mar 23, 2023
- Samsung Electronics Co., Ltd.
- YUN CHANG
- G06 - COMPUTING CALCULATING COUNTING