Yun-San Chien

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Kaohsiung City, TW

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Patents Grantslast 30 patents

Information Patent Grant
X-ray reflectometry apparatus for samples with a miniscule measurem...
- Patent number 10,151,713
- Issue date Dec 11, 2018
- Industrial Technology Research Institute
- Wen-Li Wu
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for aligning two plates during transmission sm...
- Patent number 9,847,242
- Issue date Dec 19, 2017
- Industrial Technology Research Institute
- Wen-Li Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method of applying small-angle electron scattering to...
- Patent number 9,390,888
- Issue date Jul 12, 2016
- Industrial Technology Research Institute
- Wen-Li Wu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
X-RAY REFLECTOMETRY APPARATUS FOR SAMPLES WITH A MINISCULE MEASUREM...
- Publication number 20160341674
- Publication date Nov 24, 2016
- Industrial Technology Research Institute
- Wen-Li WU
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR ALIGNING TWO PLATES DURING TRANSMISSION SM...
- Publication number 20160187267
- Publication date Jun 30, 2016
- Industrial Technology Research Institute
- Wen-Li Wu
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD OF APPLYING SMALL-ANGLE ELECTRON SCATTERING TO...
- Publication number 20150340201
- Publication date Nov 26, 2015
- Industrial Technology Research Institute
- Wen-Li Wu
- H01 - BASIC ELECTRIC ELEMENTS