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Yun-Sueng Liou
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Miao-Li, TW
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Method for improving the uniformity of wafer-to-wafer film thickness
Patent number
6,218,320
Issue date
Apr 17, 2001
United Microelectronics Corp.
Tsung-Lin Lu
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...