Yun Wang

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Hitachi, JP

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Patents Grantslast 30 patents

Information Patent Grant
X-ray diffraction instrument
- Patent number 8,923,480
- Issue date Dec 30, 2014
- Hitachi, Ltd.
- Yun Wang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Evaluation System and Evaluation Method of Plastic Strain
- Publication number 20130089182
- Publication date Apr 11, 2013
- Hitachi, Ltd
- Yun WANG
- G01 - MEASURING TESTING
Information Patent Application
X-Ray Diffraction Instrument
- Publication number 20130044864
- Publication date Feb 21, 2013
- Hitachi, Ltd
- Yun Wang
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DIFFRACTION INSTRUMENT
- Publication number 20120140888
- Publication date Jun 7, 2012
- Hitachi-GE Nuclear Energy, Ltd.
- Yun WANG
- G01 - MEASURING TESTING