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Yunan ZHENG
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Fremont, CA, US
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last 30 patents
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Patent Application
DETERMINING METRICS FOR A PORTION OF A PATTERN ON A SUBSTRATE
Publication number
20230161269
Publication date
May 25, 2023
ASML NETHERLANDS B.V.
Jiao HUANG
G06 - COMPUTING CALCULATING COUNTING
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Patent Application
METHODS FOR IMPROVING PROCESS BASED CONTOUR INFORMATION OF STRUCTUR...
Publication number
20220299881
Publication date
Sep 22, 2022
ASML NETHERLANDS B.V.
Yunan ZHENG
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
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Patent Application
METHOD AND APPARATUS FOR PHOTOLITHOGRAPHIC IMAGING
Publication number
20220276564
Publication date
Sep 1, 2022
Mir Farrokh SHAYEGAN SALEK
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY