Yunfei En

Person

Guangdong, CN

People

Patents Grantslast 30 patents

Information Patent Grant
Method, device and system for health monitoring of system-on-chip
- Patent number 11,231,702
- Issue date Jan 25, 2022
- Fifth Electronics Research Institute of Ministry of Industry and Information...
- Yiqiang Chen
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and device of remaining life prediction for electromigration...
- Patent number 10,732,216
- Issue date Aug 4, 2020
- Fifth Electronics Research Institute of Ministry of Industry and Information...
- Yiqiang Chen
- G01 - MEASURING TESTING
Information Patent Grant
ESD failure early warning circuit for integrated circuit
- Patent number 10,598,713
- Issue date Mar 24, 2020
- Fifth Electronics Research Institute of Ministry of Industry and Information...
- Yiqiang Chen
- G01 - MEASURING TESTING
Information Patent Grant
On-chip TDDB degradation monitoring and failure early warning circu...
- Patent number 10,503,578
- Issue date Dec 10, 2019
- Fifth Electronics Research Institute of Ministry of Industry and Information...
- Yiqiang Chen
- G01 - MEASURING TESTING
Information Patent Grant
System and method for health monitoring and early warning for elect...
- Patent number 10,458,823
- Issue date Oct 29, 2019
- Fifth Electronics Research Institute of Ministry of Industry and Information...
- Yiqiang Chen
- G01 - MEASURING TESTING
Information Patent Grant
Method and system of close-loop analysis to electronic component fa...
- Patent number 10,191,480
- Issue date Jan 29, 2019
- FIFTH ELECTRONICS RESEARCH INSTITUTE OF MINISTRY OF INDUSTRY AND INFORMATION...
- Xiaoqi He
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and device of remaining life prediction for electromigration...
- Patent number 9,952,275
- Issue date Apr 24, 2018
- Fifth Electronics Research Institute of Ministry of Industry and Information...
- Yiqiang Chen
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for constructing component fault tree based on ph...
- Patent number 9,430,315
- Issue date Aug 30, 2016
- Fifth Electronics Research Institute of Ministry of Industry and Information...
- Xiaoqi He
- G05 - CONTROLLING REGULATING
Information Patent Grant
Prognostic circuit of electromigration failure for integrated circuit
- Patent number 9,329,228
- Issue date May 3, 2016
- FIFTH ELECTRONICS RESEARCH INSTITUTE OF MINISTRY OF INDUSTRY AND INFORMATION...
- Yiqiang Chen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ON-CHIP TDDB DEGRADATION MONITORING AND FAILURE EARLY WARNING CIRCU...
- Publication number 20190205196
- Publication date Jul 4, 2019
- FIFTH ELECTRONICS RESEARCH INSTITUTE OF MINISTRY OF INDUSTRY AND INFORMATION...
- Yiqiang Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR HEALTH MONITORING AND EARLY WARNING FOR ELECT...
- Publication number 20190154475
- Publication date May 23, 2019
- FIFTH ELECTRONICS RESEARCH INSTITUTE OF MINISTRY OF INDUSTRY AND INFORMATION...
- Yiqiang Chen
- G01 - MEASURING TESTING
Information Patent Application
ESD FAILURE EARLY WARNING CIRCUIT FOR INTEGRATED CIRCUIT
- Publication number 20190079126
- Publication date Mar 14, 2019
- FIFTH ELECTRONICS RESEARCH INSTITUTE OF MINISTRY OF INDUSTRY AND INFORMATION...
- Yiqiang Chen
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD, DEVICE AND SYSTEM FOR HEALTH MONITORING OF SYSTEM-ON-CHIP
- Publication number 20190064786
- Publication date Feb 28, 2019
- Fifth Electronics Research Institute of Ministry o f Industry and Information...
- Yiqiang Chen
- G05 - CONTROLLING REGULATING
Information Patent Application
Method and Device of Remaining Life Prediction for Electromigration...
- Publication number 20180188316
- Publication date Jul 5, 2018
- Fifth Electronics Research Institute of Ministry of Industry and Information...
- Yiqiang Chen
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM OF CLOSE-LOOP ANALYSIS TO ELECTRONIC COMPONENT FA...
- Publication number 20180136640
- Publication date May 17, 2018
- FIFTH ELECTRONICS RESEARCH INSTITUTE OF MINISTRY OF INDUSTRY AND INFORMATION...
- Xiaoqi He
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method And System For Constructing Component Fault Tree Based On Ph...
- Publication number 20150193290
- Publication date Jul 9, 2015
- Xiaoqi He
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR PERFORMING COMPONENTS FAULT PROBLEM CLOSE LOO...
- Publication number 20150168271
- Publication date Jun 18, 2015
- Fifth Electronics Research Institute of Ministry of Industry and Information...
- Xiaoqi He
- G01 - MEASURING TESTING
Information Patent Application
Method and Device of Remaining Life Prediction for Electromigration...
- Publication number 20150051851
- Publication date Feb 19, 2015
- Fifth Electronics Research Institute of Ministry of Industry and Information...
- Yiqiang Chen
- G01 - MEASURING TESTING
Information Patent Application
Prognostic Circuit of Electromigration Failure for Integrated Circuit
- Publication number 20140232428
- Publication date Aug 21, 2014
- Fifth Electronics Research Institute of Ministry of Industry and Information...
- Yiqiang Chen
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Method, device and system for health monitoring of system-on-chip

Method and device of remaining life prediction for electromigration...

ESD failure early warning circuit for integrated circuit

On-chip TDDB degradation monitoring and failure early warning circu...

System and method for health monitoring and early warning for elect...

Method and system of close-loop analysis to electronic component fa...

Method and device of remaining life prediction for electromigration...

Method and system for constructing component fault tree based on ph...

Prognostic circuit of electromigration failure for integrated circuit

Patents Applicationslast 30 patents

ON-CHIP TDDB DEGRADATION MONITORING AND FAILURE EARLY WARNING CIRCU...

SYSTEM AND METHOD FOR HEALTH MONITORING AND EARLY WARNING FOR ELECT...

ESD FAILURE EARLY WARNING CIRCUIT FOR INTEGRATED CIRCUIT

METHOD, DEVICE AND SYSTEM FOR HEALTH MONITORING OF SYSTEM-ON-CHIP

Method and Device of Remaining Life Prediction for Electromigration...

METHOD AND SYSTEM OF CLOSE-LOOP ANALYSIS TO ELECTRONIC COMPONENT FA...

Method And System For Constructing Component Fault Tree Based On Ph...

METHOD AND SYSTEM FOR PERFORMING COMPONENTS FAULT PROBLEM CLOSE LOO...

Method and Device of Remaining Life Prediction for Electromigration...

Prognostic Circuit of Electromigration Failure for Integrated Circuit