Yung C. Lee

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Cupertino, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method for synchronizing particle counters to external events
- Patent number 5,235,625
- Issue date Aug 10, 1993
- High Yield Technology
- James B. Stolz
- G01 - MEASURING TESTING
Information Patent Grant
Low cost stage for raster scanning of semiconductor wafers
- Patent number 5,212,580
- Issue date May 18, 1993
- High Yield Technology
- George L. Coad
- G02 - OPTICS