Yung-Chin Liu

Person

Chu-pei City, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Key management system providing secure management of cryptographic...
- Patent number 12,113,895
- Issue date Oct 8, 2024
- PUFsecurity Corporation
- Yung-Hsiang Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image processing method for light emitting device
- Patent number 11,526,978
- Issue date Dec 13, 2022
- MPI Corporation
- Ping-Ying Wu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Physical unclonable function based true random number generator, me...
- Patent number 11,487,505
- Issue date Nov 1, 2022
- PUFsecurity Corporation
- Chun-Yuan Yu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Light emitting element detecting method and equipment
- Patent number 11,451,714
- Issue date Sep 20, 2022
- MPI Corporation
- Ping-Ying Wu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical inspection system
- Patent number 11,346,789
- Issue date May 31, 2022
- MPI Corporation
- Ping-Ying Wu
- G01 - MEASURING TESTING
Information Patent Grant
Aligning method for use in semiconductor inspection apparatus
- Patent number 10,678,370
- Issue date Jun 9, 2020
- MPI CORPORATION
- Lin-Lin Chih
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Operating method for inspecting equipment
- Patent number 10,048,844
- Issue date Aug 14, 2018
- MPI CORPORATION
- Stojan Kanev
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
KEY MANAGEMENT SYSTEM PROVIDING SECURE MANAGEMENT OF CRYPTOGRAPHIC...
- Publication number 20220191017
- Publication date Jun 16, 2022
- PUFsecurity Corporation
- Yung-Hsiang Liu
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
METHOD OF ALIGNING WAFER
- Publication number 20220005721
- Publication date Jan 6, 2022
- MPI Corporation
- Yung-Chin LIU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PHYSICAL UNCLONABLE FUNCTION BASED TRUE RANDOM NUMBER GENERATOR, ME...
- Publication number 20210385094
- Publication date Dec 9, 2021
- PUFsecurity Corporation
- Chun-Yuan Yu
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
OPTICAL INSPECTION SYSTEM
- Publication number 20210181120
- Publication date Jun 17, 2021
- MPI Corporation
- PING-YING WU
- G01 - MEASURING TESTING
Information Patent Application
LIGHT EMITTING ELEMENT DETECTING METHOD AND EQUIPMENT
- Publication number 20210185211
- Publication date Jun 17, 2021
- MPI Corporation
- PING-YING WU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE PROCESSING METHOD FOR LIGHT EMITTING DEVICE
- Publication number 20210183047
- Publication date Jun 17, 2021
- MPI Corporation
- PING-YING WU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ALIGNING METHOD FOR USE IN SEMICONDUCTOR INSPECTION APPARATUS
- Publication number 20190171328
- Publication date Jun 6, 2019
- MPI Corporation
- Lin-Lin Chih
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPERATING METHOD FOR INSPECTING EQUIPMENT
- Publication number 20160210028
- Publication date Jul 21, 2016
- MPI Corporation
- Stojan Kanev
- G06 - COMPUTING CALCULATING COUNTING

Yung-Chin Liu

Person

Patents Grantslast 30 patents

Key management system providing secure management of cryptographic...

Image processing method for light emitting device

Physical unclonable function based true random number generator, me...

Light emitting element detecting method and equipment

Optical inspection system

Aligning method for use in semiconductor inspection apparatus

Operating method for inspecting equipment

Patents Applicationslast 30 patents

KEY MANAGEMENT SYSTEM PROVIDING SECURE MANAGEMENT OF CRYPTOGRAPHIC...

METHOD OF ALIGNING WAFER

PHYSICAL UNCLONABLE FUNCTION BASED TRUE RANDOM NUMBER GENERATOR, ME...

OPTICAL INSPECTION SYSTEM

LIGHT EMITTING ELEMENT DETECTING METHOD AND EQUIPMENT

IMAGE PROCESSING METHOD FOR LIGHT EMITTING DEVICE

ALIGNING METHOD FOR USE IN SEMICONDUCTOR INSPECTION APPARATUS

OPERATING METHOD FOR INSPECTING EQUIPMENT