Yung-Liang Kuo

Person

Hsin-Chu, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device and method of making the same
- Patent number 12,113,031
- Issue date Oct 8, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Cheng-Chieh Hsieh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and device for wafer-level testing
- Patent number 12,066,484
- Issue date Aug 20, 2024
- Taiwan Semiconductor Manufacturing Company Ltd.
- Jun He
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for wafer-level testing
- Patent number 12,025,655
- Issue date Jul 2, 2024
- Taiwan Semiconductor Manufacturing Company Ltd.
- Jun He
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and method of making the same
- Patent number 11,830,822
- Issue date Nov 28, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Cheng-Chieh Hsieh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and device for wafer-level testing
- Patent number 11,754,621
- Issue date Sep 12, 2023
- Taiwan Semiconductor Manufacturing Company Ltd.
- Jun He
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for wafer-level testing
- Patent number 11,630,149
- Issue date Apr 18, 2023
- Taiwan Semiconductor Manufacturing Company Ltd.
- Jun He
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and method of making the same
- Patent number 11,587,883
- Issue date Feb 21, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Cheng-Chieh Hsieh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and device for wafer-level testing
- Patent number 11,448,692
- Issue date Sep 20, 2022
- TAIWANN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- Jun He
- G01 - MEASURING TESTING
Information Patent Grant
Method for producing galanthamine by a plant and electrical stimula...
- Patent number 11,109,538
- Issue date Sep 7, 2021
- Industrial Technology Research Institute
- Wen-Yin Chen
- A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING
Information Patent Grant
Method and system for wafer-level testing
- Patent number 11,073,551
- Issue date Jul 27, 2021
- Taiwan Semiconductor Manufacturing Company Ltd.
- Jun He
- G01 - MEASURING TESTING
Information Patent Grant
Fundus camera and method for self-shooting fundus
- Patent number 11,019,998
- Issue date Jun 1, 2021
- Medimaging Integrated Solution, Inc.
- Yu-Tsung Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device and method of making the same
- Patent number 10,910,321
- Issue date Feb 2, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Cheng-Chieh Hsieh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor devices with bump allocation
- Patent number 10,541,185
- Issue date Jan 21, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd
- Yung-Hsin Kuo
- G01 - MEASURING TESTING
Information Patent Grant
Method of brain wave analysis
- Patent number 9,888,882
- Issue date Feb 13, 2018
- Taiwan Advanced Sterilization Technology, Inc.
- Peng-Chieh Wu
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Test structures and testing methods for semiconductor devices
- Patent number 9,891,273
- Issue date Feb 13, 2018
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yung-Hsin Kuo
- G01 - MEASURING TESTING
Information Patent Grant
Probe card
- Patent number 9,759,745
- Issue date Sep 12, 2017
- Taiwan Semiconductor Manufacturing Company Ltd.
- Yung-Hsin Kuo
- G01 - MEASURING TESTING
Information Patent Grant
Methods of improving bump allocation for semiconductor devices and...
- Patent number 9,557,370
- Issue date Jan 31, 2017
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yung-Hsin Kuo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Display device and method for assembling the same
- Patent number 9,483,071
- Issue date Nov 1, 2016
- Compal Electronics, Inc.
- Cheng-Chao Peng
- G02 - OPTICS
Information Patent Grant
Testing probe head for wafer level testing, and test probe card
- Patent number 9,417,263
- Issue date Aug 16, 2016
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Yung-Hsin Kuo
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method for planarizing semiconductor device
- Patent number 9,378,968
- Issue date Jun 28, 2016
- United Microelectronics Corporation
- Yi-Ching Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Shield pin arrangement
- Patent number 9,261,534
- Issue date Feb 16, 2016
- Taiwan Semiconductor Manufacturing Company Limited
- Yung-Hsin Kuo
- G01 - MEASURING TESTING
Information Patent Grant
High frequency probing structure
- Patent number 9,207,261
- Issue date Dec 8, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yung-Hsin Kuo
- G01 - MEASURING TESTING
Information Patent Grant
Contactless wafer probing with improved power supply
- Patent number 9,134,368
- Issue date Sep 15, 2015
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Yung-Hsin Kuo
- G01 - MEASURING TESTING
Information Patent Grant
Probe card wiring structure
- Patent number 8,841,931
- Issue date Sep 23, 2014
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yung-Hsin Kuo
- G01 - MEASURING TESTING
Information Patent Grant
Method of fabricating a semiconductor test probe head
- Patent number 8,832,933
- Issue date Sep 16, 2014
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Yung-Hsin Kuo
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Probe head formation methods employing guide plate raising assembly...
- Patent number 8,723,538
- Issue date May 13, 2014
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Wensen Hung
- G01 - MEASURING TESTING
Information Patent Grant
Method of PLSCR inhibition for cancer therapy
- Patent number 8,691,229
- Issue date Apr 8, 2014
- Err-Cheng CHAN
- Err-Cheng Chan
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Non-reflow probe card structure
- Patent number 8,643,394
- Issue date Feb 4, 2014
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yung-Hsin Kuo
- G01 - MEASURING TESTING
Information Patent Grant
Transfection with micro explosion enacted by coated dry ice particles
- Patent number 8,415,160
- Issue date Apr 9, 2013
- National Yang-Ming University
- Fu-Jen Kao
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Universal array type probe card design for semiconductor device tes...
- Patent number 8,248,091
- Issue date Aug 21, 2012
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Hsu Ming Cheng
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MAKING THE SAME
- Publication number 20240371787
- Publication date Nov 7, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Cheng-Chieh HSIEH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND DEVICE FOR WAFER-LEVEL TESTING
- Publication number 20240361380
- Publication date Oct 31, 2024
- Taiwan Semiconductor Manufacturing company Ltd.
- JUN HE
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR WAFER-LEVEL TESTING
- Publication number 20240310434
- Publication date Sep 19, 2024
- Taiwan Semiconductor Manufacturing company Ltd.
- JUN HE
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL COHERENCE TOMOGRAPHY (OCT) SELF-TESTING SYSTEM, OPTICAL COH...
- Publication number 20240277224
- Publication date Aug 22, 2024
- Medimaging Integrated Solution, Inc.
- Chu-Ming Cheng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MAKING THE SAME
- Publication number 20230387038
- Publication date Nov 30, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Cheng-Chieh HSIEH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND DEVICE FOR WAFER-LEVEL TESTING
- Publication number 20230366925
- Publication date Nov 16, 2023
- Taiwan Semiconductor Manufacturing company Ltd.
- JUN HE
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC DEVICES WITH TOUCH SENSITIVE SURFACES AND USER INPUT DEV...
- Publication number 20230305600
- Publication date Sep 28, 2023
- Hewlett-Packard Development Company, L.P.
- LO-CHUN TUNG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR WAFER-LEVEL TESTING
- Publication number 20230251306
- Publication date Aug 10, 2023
- Taiwan Semiconductor Manufacturing company Ltd.
- JUN HE
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MAKING THE SAME
- Publication number 20230197631
- Publication date Jun 22, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Cheng-Chieh HSIEH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPHTHALMOLOGY INSPECTION DEVICE AND PUPIL TRACKING METHOD
- Publication number 20230000344
- Publication date Jan 5, 2023
- Medimaging Integrated Solution, Inc.
- Yu Chian Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND DEVICE FOR WAFER-LEVEL TESTING
- Publication number 20220326300
- Publication date Oct 13, 2022
- Taiwan Semiconductor Manufacturing company Ltd.
- JUN HE
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR WAFER-LEVEL TESTING
- Publication number 20210311110
- Publication date Oct 7, 2021
- Taiwan Semiconductor Manufacturing company Ltd.
- JUN HE
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR WAFER-LEVEL TESTING
- Publication number 20210199710
- Publication date Jul 1, 2021
- Taiwan Semiconductor Manufacturing company Ltd.
- JUN HE
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MAKING THE SAME
- Publication number 20210159187
- Publication date May 27, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Cheng-Chieh HSIEH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FUNDUS CAMERA AND METHOD FOR SELF-SHOOTING FUNDUS
- Publication number 20200121185
- Publication date Apr 23, 2020
- Medimaging Integrated Solution, Inc.
- Yu-Tsung LEE
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
METHOD AND SYSTEM FOR WAFER-LEVEL TESTING
- Publication number 20200064396
- Publication date Feb 27, 2020
- Taiwan Semiconductor Manufacturing company Ltd.
- JUN HE
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR PRODUCING GALANTHAMINE BY A PLANT AND ELECTRICAL STIMULA...
- Publication number 20190203238
- Publication date Jul 4, 2019
- Industrial Technology Research Institute
- Wen-Yin CHEN
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MAKING THE SAME
- Publication number 20190164905
- Publication date May 30, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Cheng-Chieh HSIEH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF UTILIZING ENZYME FOR ISOTHERMAL NUCLEIC ACID HYBRIDIZATION
- Publication number 20190112646
- Publication date Apr 18, 2019
- GENPRONEX BIOMEDICAL INC.
- ERR-CHENG CHAN
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
METHOD AND ASSOCIATED PROCESSOR FOR IMPROVING SOFTWARE EXECUTION OF...
- Publication number 20180121234
- Publication date May 3, 2018
- MEDIATEK INC.
- Yi-Chin Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICES WITH BUMP ALLOCATION
- Publication number 20170117199
- Publication date Apr 27, 2017
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yung-Hsin KUO
- G01 - MEASURING TESTING
Information Patent Application
Method for Planarizing Semiconductor Device
- Publication number 20160064241
- Publication date Mar 3, 2016
- UNITED MICROELECTRONICS CORPORATION
- YI-CHING WU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROBE CARD
- Publication number 20150309074
- Publication date Oct 29, 2015
- Taiwan Semiconductor Manufacturing company Ltd.
- YUNG-HSIN KUO
- G01 - MEASURING TESTING
Information Patent Application
DISPLAY DEVICE AND METHOD FOR ASSEMBLING THE SAME
- Publication number 20150173225
- Publication date Jun 18, 2015
- Compal Electronics, Inc.
- Cheng-Chao Peng
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
HIGH FREQUENCY PROBING STRUCTURE
- Publication number 20150048861
- Publication date Feb 19, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yung-Hsin Kuo
- G01 - MEASURING TESTING
Information Patent Application
TEST PROBE CARD
- Publication number 20140347085
- Publication date Nov 27, 2014
- Yung-Hsin KUO
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF BRAIN WAVE ANALYSIS
- Publication number 20140296731
- Publication date Oct 2, 2014
- Taiwan Advanced Sterilization Technology, Inc.
- Peng-Chieh Wu
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
NERVE STIMULATION SYSTEM AND WIREBOARD THEREOF
- Publication number 20140296939
- Publication date Oct 2, 2014
- Taiwan Advanced Sterilization Technology, Inc.
- Peng-Chieh Wu
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
SHIELD PIN ARRANGEMENT
- Publication number 20140028338
- Publication date Jan 30, 2014
- Taiwan Semiconductor Manufacturing Company Limited
- Yung-Hsin Kuo
- G01 - MEASURING TESTING
Information Patent Application
ASSEMBLING METHOD OF DISPLAY DEVICE AND DISPLAY DEVICE
- Publication number 20130314884
- Publication date Nov 28, 2013
- ASUSTek COMPUTER INC.
- Yen-Yu Chen
- G02 - OPTICS

Yung-Liang Kuo

Person

Patents Grantslast 30 patents

Semiconductor device and method of making the same

Method and device for wafer-level testing

Method and system for wafer-level testing

Semiconductor device and method of making the same

Method and device for wafer-level testing

Method and system for wafer-level testing

Semiconductor device and method of making the same

Method and device for wafer-level testing

Method for producing galanthamine by a plant and electrical stimula...

Method and system for wafer-level testing

Fundus camera and method for self-shooting fundus

Semiconductor device and method of making the same

Semiconductor devices with bump allocation

Method of brain wave analysis

Test structures and testing methods for semiconductor devices

Probe card

Methods of improving bump allocation for semiconductor devices and...

Display device and method for assembling the same

Testing probe head for wafer level testing, and test probe card

Method for planarizing semiconductor device

Shield pin arrangement

High frequency probing structure

Contactless wafer probing with improved power supply

Probe card wiring structure

Method of fabricating a semiconductor test probe head

Probe head formation methods employing guide plate raising assembly...

Method of PLSCR inhibition for cancer therapy

Non-reflow probe card structure

Transfection with micro explosion enacted by coated dry ice particles

Universal array type probe card design for semiconductor device tes...

Patents Applicationslast 30 patents

SEMICONDUCTOR DEVICE AND METHOD OF MAKING THE SAME

METHOD AND DEVICE FOR WAFER-LEVEL TESTING

METHOD AND SYSTEM FOR WAFER-LEVEL TESTING

OPTICAL COHERENCE TOMOGRAPHY (OCT) SELF-TESTING SYSTEM, OPTICAL COH...

SEMICONDUCTOR DEVICE AND METHOD OF MAKING THE SAME

METHOD AND DEVICE FOR WAFER-LEVEL TESTING

ELECTRONIC DEVICES WITH TOUCH SENSITIVE SURFACES AND USER INPUT DEV...

METHOD AND SYSTEM FOR WAFER-LEVEL TESTING

SEMICONDUCTOR DEVICE AND METHOD OF MAKING THE SAME

OPHTHALMOLOGY INSPECTION DEVICE AND PUPIL TRACKING METHOD

METHOD AND DEVICE FOR WAFER-LEVEL TESTING

METHOD AND SYSTEM FOR WAFER-LEVEL TESTING

METHOD AND DEVICE FOR WAFER-LEVEL TESTING

SEMICONDUCTOR DEVICE AND METHOD OF MAKING THE SAME

FUNDUS CAMERA AND METHOD FOR SELF-SHOOTING FUNDUS

METHOD AND SYSTEM FOR WAFER-LEVEL TESTING

METHOD FOR PRODUCING GALANTHAMINE BY A PLANT AND ELECTRICAL STIMULA...

SEMICONDUCTOR DEVICE AND METHOD OF MAKING THE SAME

METHOD OF UTILIZING ENZYME FOR ISOTHERMAL NUCLEIC ACID HYBRIDIZATION

METHOD AND ASSOCIATED PROCESSOR FOR IMPROVING SOFTWARE EXECUTION OF...

SEMICONDUCTOR DEVICES WITH BUMP ALLOCATION

Method for Planarizing Semiconductor Device

PROBE CARD

DISPLAY DEVICE AND METHOD FOR ASSEMBLING THE SAME

HIGH FREQUENCY PROBING STRUCTURE

TEST PROBE CARD

METHOD OF BRAIN WAVE ANALYSIS

NERVE STIMULATION SYSTEM AND WIREBOARD THEREOF

SHIELD PIN ARRANGEMENT

ASSEMBLING METHOD OF DISPLAY DEVICE AND DISPLAY DEVICE