Yung Shun Yang

Person

Tainan, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Wafer backside defect detection method and wafer backside defect de...
- Patent number 11,821,847
- Issue date Nov 21, 2023
- United Microelectronics Corp.
- Cheng-Hsien Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automatic detection method and automatic detection system for detec...
- Patent number 11,644,427
- Issue date May 9, 2023
- United Microelectronics Corp.
- Chia-Feng Hsiao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of monitoring processing system for processing substrate
- Patent number 10,606,253
- Issue date Mar 31, 2020
- United Microelectronics Corp.
- Lian-Hua Shih
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method of traceless labeling glycoproteins on surface and applicati...
- Patent number 9,678,082
- Issue date Jun 13, 2017
- National Sun Yat-sen University
- Po-Chiao Lin
- G01 - MEASURING TESTING
Information Patent Grant
Transflective liquid crystal display panel and liquid crystal displ...
- Patent number 8,289,459
- Issue date Oct 16, 2012
- Chimei Innolux Corporation
- Chang-Hao Yang
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Transflective liquid crystal display apparatus, liquid crystal disp...
- Patent number 7,436,475
- Issue date Oct 14, 2008
- Chi Mei Optoelectronics Corp.
- Yung-Shun Yang
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
FAULT DETECTION METHOD FOR DETECTING BEHAVIOR DEVIATION OF PARAMETERS
- Publication number 20240176335
- Publication date May 30, 2024
- United Microelectronics Corp.
- Yung-Yu YANG
- G05 - CONTROLLING REGULATING
Information Patent Application
FAULT DETECTION METHOD FOR DETECTING BEHAVIOR DEVIATION OF PARAMETERS
- Publication number 20240004374
- Publication date Jan 4, 2024
- United Microelectronics Corp.
- Yung-Yu YANG
- G05 - CONTROLLING REGULATING
Information Patent Application
WAFER BACKSIDE DEFECT DETECTION METHOD AND WAFER BACKSIDE DEFECT DE...
- Publication number 20230024259
- Publication date Jan 26, 2023
- United Microelectronics Corp.
- Cheng-Hsien CHEN
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC DETECTION METHOD AND AUTOMATIC DETECTION SYSTEM FOR DETEC...
- Publication number 20220128485
- Publication date Apr 28, 2022
- United Microelectronics Corp.
- Chia-Feng HSIAO
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MONITORING PROCESSING SYSTEM FOR PROCESSING SUBSTRATE
- Publication number 20180224817
- Publication date Aug 9, 2018
- United Microelectronics Corp.
- Lian-Hua Shih
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD OF TRACELESS LABELING GLYCOPROTEINS ON SURFACE AND APPLICATI...
- Publication number 20160123988
- Publication date May 5, 2016
- NATIONAL SUN YAT-SEN UNIVERSITY
- Po-Chiao LIN
- G01 - MEASURING TESTING
Information Patent Application
LIQUID CRYSTAL DISPLAY PANEL AND METHOD OF SCANNING SUCH LIQUID CRY...
- Publication number 20100066656
- Publication date Mar 18, 2010
- Chi Mei Optoelectronics Corp.
- Yung-Shun YANG
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
Transflective Liquid Crystal Display Panel
- Publication number 20090066895
- Publication date Mar 12, 2009
- Chi Mei Optoelectronics Corp.
- Chun-Yi Kuo
- G02 - OPTICS
Information Patent Application
Transflective liquid crystal display panel and liquid crystal displ...
- Publication number 20080225189
- Publication date Sep 18, 2008
- Chang-Hao Yang
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
TRANSFLECTIVE LIQUID CRYSTAL DISPLAY APPARATUS, LIQUID CRYSTAL DISP...
- Publication number 20070035684
- Publication date Feb 15, 2007
- Chi Mei Optoelectronics Corp.
- Yung-Shun YANG
- G02 - OPTICS

Yung Shun Yang

Person

Patents Grantslast 30 patents

Wafer backside defect detection method and wafer backside defect de...

Automatic detection method and automatic detection system for detec...

Method of monitoring processing system for processing substrate

Method of traceless labeling glycoproteins on surface and applicati...

Transflective liquid crystal display panel and liquid crystal displ...

Transflective liquid crystal display apparatus, liquid crystal disp...

Patents Applicationslast 30 patents

FAULT DETECTION METHOD FOR DETECTING BEHAVIOR DEVIATION OF PARAMETERS

FAULT DETECTION METHOD FOR DETECTING BEHAVIOR DEVIATION OF PARAMETERS

WAFER BACKSIDE DEFECT DETECTION METHOD AND WAFER BACKSIDE DEFECT DE...

AUTOMATIC DETECTION METHOD AND AUTOMATIC DETECTION SYSTEM FOR DETEC...

METHOD OF MONITORING PROCESSING SYSTEM FOR PROCESSING SUBSTRATE

METHOD OF TRACELESS LABELING GLYCOPROTEINS ON SURFACE AND APPLICATI...

LIQUID CRYSTAL DISPLAY PANEL AND METHOD OF SCANNING SUCH LIQUID CRY...

Transflective Liquid Crystal Display Panel

Transflective liquid crystal display panel and liquid crystal displ...

TRANSFLECTIVE LIQUID CRYSTAL DISPLAY APPARATUS, LIQUID CRYSTAL DISP...