Yung-Teng Tsai

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Tainan City, TW

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Patents Grantslast 30 patents

Information Patent Grant
Method for reviewing defects
- Patent number 10,156,526
- Issue date Dec 18, 2018
- United Microelectronics Corp.
- Yung-Teng Tsai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor structure and method for reviewing defects
- Patent number 10,082,471
- Issue date Sep 25, 2018
- United Microelectronics Corp.
- Yung-Teng Tsai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test structure for electron beam inspection and method for defect d...
- Patent number 9,711,326
- Issue date Jul 18, 2017
- United Microelectronics Corp.
- Kuan-Chun Lin
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR REVIEWING DEFECTS
- Publication number 20180356347
- Publication date Dec 13, 2018
- UNITED MICROELECTRONICS CORP.
- Yung-Teng Tsai
- G01 - MEASURING TESTING
Information Patent Application
DIE
- Publication number 20180356348
- Publication date Dec 13, 2018
- UNITED MICROELECTRONICS CORP.
- Yung-Teng Tsai
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR STRUCTURE AND METHOD FOR REVIEWING DEFECTS
- Publication number 20180188185
- Publication date Jul 5, 2018
- UNITED MICROELECTRONICS CORP.
- Yung-Teng Tsai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST STRUCTURE FOR ELECTRON BEAM INSPECTION AND METHOD FOR DEFECT D...
- Publication number 20170207060
- Publication date Jul 20, 2017
- UNITED MICROELECTRONICS CORP.
- Kuan-Chun Lin
- H01 - BASIC ELECTRIC ELEMENTS