YUNHYOUNG NAM

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Seoul, KR

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Patents Grantslast 30 patents

Information Patent Grant
Method for measuring CD using scanning electron microscope
- Patent number 11,740,073
- Issue date Aug 29, 2023
- Samsung Electronics Co., Ltd.
- Jooho Kim
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF DETECTING MEASUREMENT ERROR OF SEM EQUIPMENT AND METHOD O...
- Publication number 20230043003
- Publication date Feb 9, 2023
- Samsung Electronics Co., Ltd.
- Nohong KWAK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR MEASURING CD USING SCANNING ELECTRON MICROSCOPE
- Publication number 20220299315
- Publication date Sep 22, 2022
- Samsung Electronics Co., Ltd.
- JOOHO KIM
- G06 - COMPUTING CALCULATING COUNTING