Yunje CHO

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Seoul, KR

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Patents Grantslast 30 patents

Information Patent Grant
Estimating heights of defects in a wafer by scaling a 3D model usin...
- Patent number 12,057,336
- Issue date Aug 6, 2024
- Samsung Electronics Co., Ltd.
- Shashank Shrikant Agashe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Spectroscopic measuring apparatus and method, and method for fabric...
- Patent number 11,320,259
- Issue date May 3, 2022
- Samsung Electronics Co., Ltd.
- Kwangrak Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Tomography apparatus and method of reconstructing tomography image
- Patent number 9,836,861
- Issue date Dec 5, 2017
- Samsung Electronics Co., Ltd.
- Woo-hyun Nam
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SUBSTRATE ANALYSIS SYSTEM
- Publication number 20240112881
- Publication date Apr 4, 2024
- Samsung Electronics Co., Ltd.
- Jonghyeok PARK
- G01 - MEASURING TESTING
Information Patent Application
SCANNING ELECTRON MICROSCOPE DEVICE, SEMICONDUCTOR MANUFACTURING DE...
- Publication number 20230074302
- Publication date Mar 9, 2023
- Samsung Electronics Co., Ltd.
- Yunje CHO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ESTIMATING HEIGHTS OF DEFECTS IN A WAFER
- Publication number 20220189806
- Publication date Jun 16, 2022
- Samsung Electronics Co., Ltd.
- Shashank Shrikant Agashe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SPECTROSCOPIC MEASURING APPARATUS AND METHOD, AND METHOD FOR FABRIC...
- Publication number 20220049949
- Publication date Feb 17, 2022
- Samsung Electronics Co., Ltd.
- Kwangrak Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TOMOGRAPHY APPARATUS AND METHOD OF RECONSTRUCTING TOMOGRAPHY IMAGE
- Publication number 20160171726
- Publication date Jun 16, 2016
- Samsung Electronics Co., Ltd.
- Woo-hyun NAM
- G06 - COMPUTING CALCULATING COUNTING