Yunjun Lu

Person

Shanghai, CN

People

Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for detecting wavefront aberration of objectiv...
- Patent number 11,668,625
- Issue date Jun 6, 2023
- Shanghai Institute of Optics And Fine Mechanics, Chinese Academy of Sciences
- Peng Li
- G02 - OPTICS
Information Patent Grant
Method for high-accuracy wavefront measurement base on grating shea...
- Patent number 11,340,118
- Issue date May 24, 2022
- Shanghai Institute of Optics And Fine Mechanics, Chinese Academy of Sciences
- Yunjun Lu
- G01 - MEASURING TESTING
Information Patent Grant
Light intensity fluctuation-insensitive projection objective wave a...
- Patent number 11,215,512
- Issue date Jan 4, 2022
- Shanghai Institute of Optics And Fine Mechanics, Chinese Academy of Sciences
- Feng Tang
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for detecting projection objective wave-front abe...
- Patent number 11,029,611
- Issue date Jun 8, 2021
- Shanghai Institute of Optics And Fine Mechanics, Chinese Academy of Sciences
- Feng Tang
- G01 - MEASURING TESTING
Information Patent Grant
Method for wavefront measurement of optical imaging system based on...
- Patent number 11,009,336
- Issue date May 18, 2021
- Shanghai Institute of Optics And Fine Mechanics, Chinese Academy of Sciences
- Yunjun Lu
- G01 - MEASURING TESTING
Information Patent Grant
Method for detecting wavefront aberration for optical imaging syste...
- Patent number 10,969,274
- Issue date Apr 6, 2021
- Shanghai Institute of Optics And Fine Mechanics, Chinese Academy of Sciences
- Yunjun Lu
- G01 - MEASURING TESTING
Information Patent Grant
Device for measuring point diffraction interferometric wavefront ab...
- Patent number 9,658,114
- Issue date May 23, 2017
- Shanghai Institute of Optics And Fine Mechanics, Chinese Academy of Sciences
- Feng Tang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHOD FOR DETECTING WAVEFRONT ABERRATION OF OBJECTIV...
- Publication number 20220299402
- Publication date Sep 22, 2022
- Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences
- Peng Li
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR HIGH-ACCURACY WAVEFRONT MEASUREMENT BASE ON GRATING SHEA...
- Publication number 20220074793
- Publication date Mar 10, 2022
- Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences
- Yunjun LU
- G01 - MEASURING TESTING
Information Patent Application
LIGHT INTENSITY FLUCTUATION-INSENSITIVE PROJECTION OBJECTIVE WAVE A...
- Publication number 20210208005
- Publication date Jul 8, 2021
- Shanghai Instittute of Optics And Fine Mechanics, Chinese Academy of Sciences
- Feng TANG
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR DETECTING PROJECTION OBJECTIVE WAVE-FRONT ABE...
- Publication number 20210026250
- Publication date Jan 28, 2021
- Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences
- Feng Tang
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETECTING WAVEFRONT ABERRATION FOR OPTICAL IMAGING SYSTE...
- Publication number 20200292384
- Publication date Sep 17, 2020
- Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences
- Yunjun LU
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR WAVEFRONT MEASUREMENT OF OPTICAL IMAGING SYSTEM BASED ON...
- Publication number 20200292296
- Publication date Sep 17, 2020
- Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences
- Yunjun LU
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Apparatus and method for detecting wavefront aberration of objectiv...

Method for high-accuracy wavefront measurement base on grating shea...

Light intensity fluctuation-insensitive projection objective wave a...

Device and method for detecting projection objective wave-front abe...

Method for wavefront measurement of optical imaging system based on...

Method for detecting wavefront aberration for optical imaging syste...

Device for measuring point diffraction interferometric wavefront ab...

Patents Applicationslast 30 patents

APPARATUS AND METHOD FOR DETECTING WAVEFRONT ABERRATION OF OBJECTIV...

METHOD FOR HIGH-ACCURACY WAVEFRONT MEASUREMENT BASE ON GRATING SHEA...

LIGHT INTENSITY FLUCTUATION-INSENSITIVE PROJECTION OBJECTIVE WAVE A...

DEVICE AND METHOD FOR DETECTING PROJECTION OBJECTIVE WAVE-FRONT ABE...

METHOD FOR DETECTING WAVEFRONT ABERRATION FOR OPTICAL IMAGING SYSTE...

METHOD FOR WAVEFRONT MEASUREMENT OF OPTICAL IMAGING SYSTEM BASED ON...