Yunjung JEE

Follow

Person

Seongnam-si, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Method of inspecting semiconductor wafer, an inspection system for...
- Patent number 10,269,111
- Issue date Apr 23, 2019
- Samsung Electronics Co., Ltd.
- Joonseo Song
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for measuring thickness
- Patent number 10,088,297
- Issue date Oct 2, 2018
- Samsung Electronics Co., Ltd.
- Sung Yoon Ryu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF INSPECTING SEMICONDUCTOR WAFER, AN INSPECTION SYSTEM FOR...
- Publication number 20180053292
- Publication date Feb 22, 2018
- Samsung Electronics Co., Ltd.
- Joonseo Song
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHOD FOR MEASURING THICKNESS
- Publication number 20170363418
- Publication date Dec 21, 2017
- Samsung Electronics Co., Ltd.
- Sung Yoon RYU
- G01 - MEASURING TESTING