Yunlin Zhang

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Wappingers Falls, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Method for quantification of process non uniformity using model-bas...
- Patent number 10,955,359
- Issue date Mar 23, 2021
- International Business Machines Corporation
- Robin Hsin-Kuo Chao
- G01 - MEASURING TESTING
Information Patent Grant
Measuring semiconductor device features using stepwise optical metr...
- Patent number 9,482,519
- Issue date Nov 1, 2016
- GLOBALFOUNDRIES Inc.
- Yunlin Zhang
- G01 - MEASURING TESTING
Information Patent Grant
System and method for estimating spatial characteristics of integra...
- Patent number 9,262,819
- Issue date Feb 16, 2016
- GLOBALFOUNDRIES, INC.
- Taher E. Kagalwala
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometry employing extinction coefficient modulation
- Patent number 8,860,956
- Issue date Oct 14, 2014
- International Business Machines Corporation
- Nedal R. Saleh
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MEASURING SEMICONDUCTOR DEVICE FEATURES USING STEPWISE OPTICAL METR...
- Publication number 20160161248
- Publication date Jun 9, 2016
- International Business Machines Corporation
- Yunlin Zhang
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR QUANTIFICATION OF PROCESS NON-UNIFORMITY USING MODEL-BAS...
- Publication number 20150134286
- Publication date May 14, 2015
- International Business Machines Corporation
- Robin Hsin-Kuo Chao
- G01 - MEASURING TESTING
Information Patent Application
SPECTROMETRY EMPLOYING EXTINCTION COEFFICIENT MODULATION
- Publication number 20140268181
- Publication date Sep 18, 2014
- International Business Machines Corporation
- Nedal R. Saleh
- G01 - MEASURING TESTING