Yunsheng Song

Person

Poughkeepsie, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Methods of detecting faults in real-time for semiconductor wafers
- Patent number 10,109,046
- Issue date Oct 23, 2018
- GLOBALFOUNDRIES Inc.
- Robert Boyd Finlay
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
LCR test circuit structure for detecting metal gate defect conditions
- Patent number 9,780,007
- Issue date Oct 3, 2017
- GLOBALFOUNDRIES Inc.
- Xu Ouyang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing in a semiconductor device a low resistance...
- Patent number 9,559,051
- Issue date Jan 31, 2017
- GlobalFoundries Inc.
- Yongchun Xin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Configurable interposer
- Patent number 9,524,930
- Issue date Dec 20, 2016
- International Business Machines Corporation
- Oleg Gluschenkov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Voltage contrast characterization structures and methods for within...
- Patent number 9,519,210
- Issue date Dec 13, 2016
- International Business Machines Corporation
- Oliver D. Patterson
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Semiconductor memory device employing a ferromagnetic gate
- Patent number 9,337,334
- Issue date May 10, 2016
- GLOBALFOUNDRIES Inc.
- Hari V. Mallela
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Yield enhancement for stacked chips through rotationally-connecting...
- Patent number 9,151,781
- Issue date Oct 6, 2015
- International Business Machines Corporation
- Oleg Gluschenkov
- G01 - MEASURING TESTING
Information Patent Grant
Physical design symmetry and integrated circuits enabling three dim...
- Patent number 9,029,234
- Issue date May 12, 2015
- International Business Machines Corporation
- John Matthew Safran
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Random coded integrated circuit structures and methods of making ra...
- Patent number 8,803,328
- Issue date Aug 12, 2014
- International Business Machines Corporation
- Yunsheng Song
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Configurable interposer
- Patent number 8,759,152
- Issue date Jun 24, 2014
- International Business Machines Corporation
- Oleg Gluschenkov
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Wafer alignment system with optical coherence tomography
- Patent number 8,489,225
- Issue date Jul 16, 2013
- International Business Machines Corporation
- Yongchun Xin
- G01 - MEASURING TESTING
Information Patent Grant
Security control of analysis results
- Patent number 8,429,193
- Issue date Apr 23, 2013
- International Business Machines Corporation
- Yunsheng Song
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method for compensating for tool processing variation in the routin...
- Patent number 8,369,976
- Issue date Feb 5, 2013
- International Business Machines Corporation
- Keith Kwong Hon Wong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Monitoring a process sector in a production facility
- Patent number 8,340,800
- Issue date Dec 25, 2012
- International Business Machines Corporation
- William Cote
- G05 - CONTROLLING REGULATING
Information Patent Grant
Detecting asymmetrical transistor leakage defects
- Patent number 8,294,485
- Issue date Oct 23, 2012
- International Business Machines Corporation
- Xu Ouyang
- G11 - INFORMATION STORAGE
Information Patent Grant
Configurable interposer
- Patent number 8,237,278
- Issue date Aug 7, 2012
- International Business Machines Corporation
- Oleg Gluschenkov
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Tool commonality and stratification analysis to enhance a productio...
- Patent number 8,234,001
- Issue date Jul 31, 2012
- International Business Machines Corporation
- James Rice
- G05 - CONTROLLING REGULATING
Information Patent Grant
Yield enhancement for stacked chips through rotationally-connecting...
- Patent number 8,159,247
- Issue date Apr 17, 2012
- International Business Machines Corporation
- Oleg Gluschenkov
- G01 - MEASURING TESTING
Information Patent Grant
Geometry based electrical hotspot detection in integrated circuit l...
- Patent number 8,108,803
- Issue date Jan 31, 2012
- International Business Machines Corporation
- Fook-Luen Heng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for optimizing the routing of wafers/lots based on yield
- Patent number 8,095,230
- Issue date Jan 10, 2012
- International Business Machines Corporation
- Xu Ouyang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods, systems, and computer program products for product randomi...
- Patent number 8,015,040
- Issue date Sep 6, 2011
- International Business Machines Corporation
- Susan M. Cianfrani
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method of optimizing queue times in a production cycle
- Patent number 8,005,560
- Issue date Aug 23, 2011
- International Business Machines Corporation
- Brad J. Rawlins
- G05 - CONTROLLING REGULATING
Information Patent Grant
Multidimensional process window optimization in semiconductor manuf...
- Patent number 7,962,234
- Issue date Jun 14, 2011
- International Business Machines Corporation
- Yunsheng Song
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Computer program product for excluding variations attributable to e...
- Patent number 7,953,680
- Issue date May 31, 2011
- International Business Machines Corporation
- Xu Ouyang
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method of establishing a lot grade system for product lots in a sem...
- Patent number 7,908,023
- Issue date Mar 15, 2011
- International Business Machines Corporation
- Edward J. Crawford
- G05 - CONTROLLING REGULATING
Information Patent Grant
Real time system for monitoring the commonality, sensitivity, and r...
- Patent number 7,856,332
- Issue date Dec 21, 2010
- International Business Machines Corporation
- Muthukumarasamy Karthikeyan
- G01 - MEASURING TESTING
Information Patent Grant
Method of adaptively selecting chips for reducing in-line testing i...
- Patent number 7,682,842
- Issue date Mar 23, 2010
- International Business Machines Corporation
- Rao H. Desineni
- G01 - MEASURING TESTING
Information Patent Grant
Data mining to detect performance quality of tools used repetitivel...
- Patent number 7,337,033
- Issue date Feb 26, 2008
- International Business Machines Corporation
- Viorel Ontalus
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...

Patents Applicationslast 30 patents

Information Patent Application
METHODS OF DETECTING FAULTS IN REAL-TIME FOR SEMICONDUCTOR WAFERS
- Publication number 20180025483
- Publication date Jan 25, 2018
- GLOBALFOUNDRIES INC.
- Robert Boyd FINLAY
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
VOLTAGE CONTRAST CHARACTERIZATION STRUCTURES AND METHODS FOR WITHIN...
- Publication number 20160148849
- Publication date May 26, 2016
- International Business Machines Corporation
- Oliver D. Patterson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE EMPLOYING A FERROMAGNETIC GATE
- Publication number 20150303313
- Publication date Oct 22, 2015
- International Business Machines Corporation
- Hari V. Mallela
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RANDOM CODED INTEGRATED CIRCUIT STRUCTURES AND METHODS OF MAKING RA...
- Publication number 20140203448
- Publication date Jul 24, 2014
- International Business Machines Corporation
- Yunsheng Song
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONFIGURABLE INTERPOSER
- Publication number 20140145351
- Publication date May 29, 2014
- International Business Machines Corporation
- Oleg Gluschenkov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PHYSICAL DESIGN SYMMETRY AND INTEGRATED CIRCUITS ENABLING THREE DIM...
- Publication number 20130307159
- Publication date Nov 21, 2013
- International Business Machines Corporation
- John Matthew Safran
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LCR TEST CIRCUIT STRUCTURE FOR DETECTING METAL GATE DEFECT CONDITIONS
- Publication number 20130169308
- Publication date Jul 4, 2013
- International Business Machines Corporation
- Xu Ouyang
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR DEFECT-BITMAP-FAIL PATTERNS MATCHING ANALYSIS...
- Publication number 20130016895
- Publication date Jan 17, 2013
- International Business Machines Corporation
- Zhigang Song
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONFIGURABLE INTERPOSER
- Publication number 20120241977
- Publication date Sep 27, 2012
- International Business Machines Corporation
- Oleg Gluschenkov
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
WAFER ALIGNMENT SYSTEM WITH OPTICAL COHERENCE TOMOGRAPHY
- Publication number 20120232686
- Publication date Sep 13, 2012
- International Business Machines Corporation
- Yongchun Xin
- G01 - MEASURING TESTING
Information Patent Application
YIELD ENHANCEMENT FOR STACKED CHIPS THROUGH ROTATIONALLY-CONNECTING...
- Publication number 20120146682
- Publication date Jun 14, 2012
- International Business Machines Corporation
- Oleg Gluschenkov
- G01 - MEASURING TESTING
Information Patent Application
CONFIGURABLE INTERPOSER
- Publication number 20110115082
- Publication date May 19, 2011
- International Business Machines Corporation
- Oleg Gluschenkov
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
GEOMETRY BASED ELECTRICAL HOTSPOT DETECTION IN INTEGRATED CIRCUIT L...
- Publication number 20110099529
- Publication date Apr 28, 2011
- International Business Machines Corporation
- Fook-Luen Heng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
YIELD ENHANCEMENT FOR STACKED CHIPS THROUGH ROTATIONALLY-CONNECTING...
- Publication number 20110080189
- Publication date Apr 7, 2011
- International Business Machines Corporation
- Oleg Gluschenkov
- G01 - MEASURING TESTING
Information Patent Application
TOOL COMMONALITY AND STRATIFICATION ANALYSIS TO ENHANCE A PRODUCTIO...
- Publication number 20110077765
- Publication date Mar 31, 2011
- International Business Machines Corporation
- James Rice
- G05 - CONTROLLING REGULATING
Information Patent Application
DETECTING ASYMMETRICAL TRANSISTOR LEAKAGE DEFECTS
- Publication number 20100201376
- Publication date Aug 12, 2010
- International Business Machines Corporation
- Xu Ouyang
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD AND SYSTEM OF COMMONALITY ANALYSIS FOR LOTS WITH SCRAPPED WAFER
- Publication number 20100204940
- Publication date Aug 12, 2010
- International Business Machines Corporation
- Gasner J. Barthold
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SECURITY CONTROL OF ANALYSIS RESULTS
- Publication number 20100185675
- Publication date Jul 22, 2010
- International Business Machines Corporation
- Yunsheng Song
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MONITORING A PROCESS SECTOR IN A PRODUCTION FACILITY
- Publication number 20100017010
- Publication date Jan 21, 2010
- International Business Machines Corporation
- William Cote
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD FOR OPTIMIZING THE ROUTING OF WAFERS/LOTS BASED ON YIELD
- Publication number 20090317924
- Publication date Dec 24, 2009
- International Business Machines Corporation
- Xu Ouyang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR COMPENSATING FOR TOOL PROCESSING VARIATION IN THE ROUTIN...
- Publication number 20090319074
- Publication date Dec 24, 2009
- International Business Machines Corporation
- Keith Kwong Hon Wong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTIDIMENSIONAL PROCESS WINDOW OPTIMIZATION IN SEMICONDUCTOR MANUF...
- Publication number 20090306807
- Publication date Dec 10, 2009
- International Business Machines Corporation
- Yunsheng Song
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of Adaptively Selecting Chips for Reducing In-line Testing i...
- Publication number 20090299679
- Publication date Dec 3, 2009
- International Business Machines Corporation
- RAO H. DESINENI
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF ESTABLISHING A LOT GRADE SYSTEM FOR PRODUCT LOTS IN A SEM...
- Publication number 20090182447
- Publication date Jul 16, 2009
- International Business Machines Corporation
- Edward J. Crawford
- G05 - CONTROLLING REGULATING
Information Patent Application
METHODS AND COMPUTER PROGRAM PRODUCTS FOR EXCLUDING VARIATIONS ATTR...
- Publication number 20090150811
- Publication date Jun 11, 2009
- International Business Machines Corporation
- Xu Ouyang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
REAL TIME SYSTEM FOR MONITORING THE COMMONALITY, SENSITIVITY, AND R...
- Publication number 20090143999
- Publication date Jun 4, 2009
- International Business Machines Corporation
- Muthukumarasamy Karthikeyan
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED YIELD SPLIT LOT (EWR) AND PROCESS CHANGE NOTIFICATION (PC...
- Publication number 20090125829
- Publication date May 14, 2009
- International Business Machines Corporation
- ANDREW S. DALTON
- G05 - CONTROLLING REGULATING
Information Patent Application
ADVANCED CORRELATION AND PROCESS WINDOW EVALUATION APPLICATION
- Publication number 20090119357
- Publication date May 7, 2009
- International Business Machines Corporation
- James P. Rice
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF OPTIMIZING QUEUE TIMES IN A PRODUCTION CYCLE
- Publication number 20090105854
- Publication date Apr 23, 2009
- International Business Machines Corporation
- Brad J. Rawlins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS, SYSTEMS, AND COMPUTER PROGRAM PRODUCTS FOR PRODUCT RANDOMI...
- Publication number 20080183321
- Publication date Jul 31, 2008
- International Business Machines Corporation
- Susan M. Cianfrani
- G06 - COMPUTING CALCULATING COUNTING

Yunsheng Song

Person

Patents Grantslast 30 patents

Methods of detecting faults in real-time for semiconductor wafers

LCR test circuit structure for detecting metal gate defect conditions

Method for manufacturing in a semiconductor device a low resistance...

Configurable interposer

Voltage contrast characterization structures and methods for within...

Semiconductor memory device employing a ferromagnetic gate

Yield enhancement for stacked chips through rotationally-connecting...

Physical design symmetry and integrated circuits enabling three dim...

Random coded integrated circuit structures and methods of making ra...

Configurable interposer

Wafer alignment system with optical coherence tomography

Security control of analysis results

Method for compensating for tool processing variation in the routin...

Monitoring a process sector in a production facility

Detecting asymmetrical transistor leakage defects

Configurable interposer

Tool commonality and stratification analysis to enhance a productio...

Yield enhancement for stacked chips through rotationally-connecting...

Geometry based electrical hotspot detection in integrated circuit l...

Method for optimizing the routing of wafers/lots based on yield

Methods, systems, and computer program products for product randomi...

Method of optimizing queue times in a production cycle

Multidimensional process window optimization in semiconductor manuf...

Computer program product for excluding variations attributable to e...

Method of establishing a lot grade system for product lots in a sem...

Real time system for monitoring the commonality, sensitivity, and r...

Method of adaptively selecting chips for reducing in-line testing i...

Data mining to detect performance quality of tools used repetitivel...

Patents Applicationslast 30 patents

METHODS OF DETECTING FAULTS IN REAL-TIME FOR SEMICONDUCTOR WAFERS

VOLTAGE CONTRAST CHARACTERIZATION STRUCTURES AND METHODS FOR WITHIN...

SEMICONDUCTOR MEMORY DEVICE EMPLOYING A FERROMAGNETIC GATE

RANDOM CODED INTEGRATED CIRCUIT STRUCTURES AND METHODS OF MAKING RA...

CONFIGURABLE INTERPOSER

PHYSICAL DESIGN SYMMETRY AND INTEGRATED CIRCUITS ENABLING THREE DIM...

LCR TEST CIRCUIT STRUCTURE FOR DETECTING METAL GATE DEFECT CONDITIONS

METHOD AND SYSTEM FOR DEFECT-BITMAP-FAIL PATTERNS MATCHING ANALYSIS...

CONFIGURABLE INTERPOSER

WAFER ALIGNMENT SYSTEM WITH OPTICAL COHERENCE TOMOGRAPHY

YIELD ENHANCEMENT FOR STACKED CHIPS THROUGH ROTATIONALLY-CONNECTING...

CONFIGURABLE INTERPOSER

GEOMETRY BASED ELECTRICAL HOTSPOT DETECTION IN INTEGRATED CIRCUIT L...

YIELD ENHANCEMENT FOR STACKED CHIPS THROUGH ROTATIONALLY-CONNECTING...

TOOL COMMONALITY AND STRATIFICATION ANALYSIS TO ENHANCE A PRODUCTIO...

DETECTING ASYMMETRICAL TRANSISTOR LEAKAGE DEFECTS

METHOD AND SYSTEM OF COMMONALITY ANALYSIS FOR LOTS WITH SCRAPPED WAFER

SECURITY CONTROL OF ANALYSIS RESULTS

MONITORING A PROCESS SECTOR IN A PRODUCTION FACILITY

METHOD FOR OPTIMIZING THE ROUTING OF WAFERS/LOTS BASED ON YIELD

METHOD FOR COMPENSATING FOR TOOL PROCESSING VARIATION IN THE ROUTIN...

MULTIDIMENSIONAL PROCESS WINDOW OPTIMIZATION IN SEMICONDUCTOR MANUF...

Method of Adaptively Selecting Chips for Reducing In-line Testing i...

METHOD OF ESTABLISHING A LOT GRADE SYSTEM FOR PRODUCT LOTS IN A SEM...

METHODS AND COMPUTER PROGRAM PRODUCTS FOR EXCLUDING VARIATIONS ATTR...

REAL TIME SYSTEM FOR MONITORING THE COMMONALITY, SENSITIVITY, AND R...

AUTOMATED YIELD SPLIT LOT (EWR) AND PROCESS CHANGE NOTIFICATION (PC...

ADVANCED CORRELATION AND PROCESS WINDOW EVALUATION APPLICATION

METHOD OF OPTIMIZING QUEUE TIMES IN A PRODUCTION CYCLE

METHODS, SYSTEMS, AND COMPUTER PROGRAM PRODUCTS FOR PRODUCT RANDOMI...