Yuntao Zhu

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Shanghai, CN

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Patents Grantslast 30 patents

Information Patent Grant
On die jitter tolerance test
- Patent number 9,209,818
- Issue date Dec 8, 2015
- Parade Technologies, Ltd.
- Ming Qu
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
On die jitter tolerance test
- Patent number 8,923,375
- Issue date Dec 30, 2014
- Parade Technologies, Inc.
- Ming Qu
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
On die low power high accuracy reference clock generation
- Patent number 8,610,479
- Issue date Dec 17, 2013
- Parade Technologies, Ltd.
- Kochung Lee
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
On die jitter tolerance test
- Publication number 20150109037
- Publication date Apr 23, 2015
- PARADE TECHNOLOGIES, INC.
- Ming Qu
- G01 - MEASURING TESTING
Information Patent Application
On Die Jitter Tolerance Test
- Publication number 20140003480
- Publication date Jan 2, 2014
- PARADE TECHNOLOGIES, INC.
- Ming Qu
- G01 - MEASURING TESTING
Information Patent Application
ON DIE LOW POWER HIGH ACCURACY REFERENCE CLOCK GENERATION
- Publication number 20130093466
- Publication date Apr 18, 2013
- Kochung Lee
- H03 - BASIC ELECTRONIC CIRCUITRY