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Yunwoo LEE
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Anyang-si, KR
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Patents Grants
last 30 patents
Information
Patent Grant
Electronic device and method for measuring location of electronic d...
Patent number
11,895,616
Issue date
Feb 6, 2024
Samsung Electronics Co., Ltd.
Sungjung Joo
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Method of providing location information to external electronic dev...
Patent number
11,448,776
Issue date
Sep 20, 2022
Samsung Electronics Co., Ltd.
Kyonggon Choi
G01 - MEASURING TESTING
Information
Patent Grant
Electronic device and method for measuring position information of...
Patent number
10,656,279
Issue date
May 19, 2020
Samsung Electronics Co., Ltd.
Yunwoo Lee
G01 - MEASURING TESTING
Information
Patent Grant
Electronic device and method for measuring position information of...
Patent number
10,139,494
Issue date
Nov 27, 2018
Samsung Electronics Co., Ltd.
Yunwoo Lee
G01 - MEASURING TESTING
Information
Patent Grant
Electronic device and method for measuring position information of...
Patent number
9,696,428
Issue date
Jul 4, 2017
Samsung Electronics Co., Ltd.
Yunwoo Lee
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
ELECTRONIC DEVICE AND METHOD FOR MEASURING LOCATION OF ELECTRONIC D...
Publication number
20210392613
Publication date
Dec 16, 2021
Samsung Electronics Co., Ltd.
Sungjung JOO
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF PROVIDING LOCATION INFORMATION TO EXTERNAL ELECTRONIC DEV...
Publication number
20200132863
Publication date
Apr 30, 2020
Samsung Electronics Co., Ltd.
Kyonggon CHOI
G01 - MEASURING TESTING
Information
Patent Application
ELECTRONIC DEVICE AND METHOD FOR MEASURING POSITION INFORMATION OF...
Publication number
20190049589
Publication date
Feb 14, 2019
Samsung Electronics Co., Ltd.
Yunwoo LEE
G01 - MEASURING TESTING
Information
Patent Application
ELECTRONIC DEVICE AND METHOD FOR MEASURING POSITION INFORMATION OF...
Publication number
20170261614
Publication date
Sep 14, 2017
Samsung Electronics Co., Ltd.
Yunwoo LEE
G01 - MEASURING TESTING
Information
Patent Application
ELECTRONIC DEVICE AND METHOD FOR MEASURING POSITION INFORMATION OF...
Publication number
20150369921
Publication date
Dec 24, 2015
Samsung Electronics Co., Ltd.
Yunwoo LEE
G01 - MEASURING TESTING