Yuping Gu

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San Jose, CA, US

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Patents Applicationslast 30 patents

Information Patent Application
Patterned wafer thickness detection system
- Publication number 20060062897
- Publication date Mar 23, 2006
- APPLIED MATERIALS, INC.
- Yuping Gu
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...