Yuqing Gong

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Test vehicle for package testing
- Patent number 11,073,550
- Issue date Jul 27, 2021
- Xilinx, Inc.
- Yuqing Gong
- G01 - MEASURING TESTING
Information Patent Grant
Circuit for and method of testing bond connections between a first...
- Patent number 10,262,911
- Issue date Apr 16, 2019
- Xilinx, Inc.
- Yuqing Gong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of testing a semiconductor structure
- Patent number 8,810,269
- Issue date Aug 19, 2014
- Xilinx, Inc.
- Yuqing Gong
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF TESTING A SEMICONDUCTOR STRUCTURE
- Publication number 20140091819
- Publication date Apr 3, 2014
- Xilinx, Inc.
- Yuqing Gong
- G01 - MEASURING TESTING