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Yuqing Zhu
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Andover, MA, US
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last 30 patents
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Patent Application
MULTIPLE CHANNEL INTERFEROMETRIC SURFACE CONTOUR MEASUREMENT SYSTEM
Publication number
20090324212
Publication date
Dec 31, 2009
DIMENSIONAL PHOTONICS INTERNATIONAL, INC.
Robert F. Dillon
G01 - MEASURING TESTING
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Patent Application
Multiple Channel Interferometric Surface Contour Measurement System
Publication number
20080165341
Publication date
Jul 10, 2008
DIMENSIONAL PHOTONICS INTERNATIONAL, INC.
Robert F. Dillon
G01 - MEASURING TESTING