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Rishon LeZiyyon, IL
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Patents Grants
last 30 patents
Information
Patent Grant
Compensating for an electromagnetic interference induced deviation...
Patent number
11,276,545
Issue date
Mar 15, 2022
Applied Materials Israel Ltd.
Yosef Basson
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Chuck for supporting a wafer
Patent number
10,446,434
Issue date
Oct 15, 2019
Applied Materials Israel Ltd.
Doron Korngut
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Scanning an object using multiple mechanical stages
Patent number
10,068,748
Issue date
Sep 4, 2018
Applied Materials Israel Ltd.
Yoram Uziel
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System and method for temperature control of a semiconductor wafer
Patent number
9,111,971
Issue date
Aug 18, 2015
Applied Materials Israel, Ltd.
Lavy Shavit
F27 - FURNACES KILNS OVENS RETORTS
Information
Patent Grant
Inspection of EUV masks by a DUV mask inspection tool
Patent number
8,207,504
Issue date
Jun 26, 2012
Applied Materials Israel, Ltd.
Chaim Braude
B82 - NANO-TECHNOLOGY
Patents Applications
last 30 patents
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Patent Application
CHUCK FOR SUPPORTING A WAFER
Publication number
20170309511
Publication date
Oct 26, 2017
APPLIED MATERIALS ISRAEL LTD.
Doron Korngut
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SCANNING AN OBJECT USING MULTIPLE MECHANICAL STAGES
Publication number
20170084425
Publication date
Mar 23, 2017
APPLIED MATERIALS ISRAEL LTD.
Yoram Uziel
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SYSTEM AND METHOD FOR TEMPERATURE CONTROL OF A SEMICONDUCTOR WAFER
Publication number
20140027437
Publication date
Jan 30, 2014
Lavy Shavit
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
INSPECTION OF EUV MASKS BY A DUV MASK INSPECTION TOOL
Publication number
20110121193
Publication date
May 26, 2011
APPLIED MATERIALS ISRAEL LIMITED
Chaim Braude
B82 - NANO-TECHNOLOGY