Yuri Ikeda

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Test access control for plural processors of an integrated circuit
- Patent number 7,743,278
- Issue date Jun 22, 2010
- Renesas Technology Corp.
- Yuri Ikeda
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor integrated circuit device
- Publication number 20070226558
- Publication date Sep 27, 2007
- RENESAS TECHNOLOGY CORP.
- Yuri Ikeda
- G01 - MEASURING TESTING