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Yuri Shirman
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Rehovot, IL
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Patents Grants
last 30 patents
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Patent Grant
Time-domain optical metrology and inspection of semiconductor devices
Patent number
11,366,398
Issue date
Jun 21, 2022
Nova Ltd.
Gilad Barak
G01 - MEASURING TESTING
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Patent Grant
Method and system for providing a compensated auger spectrum
Patent number
7,912,657
Issue date
Mar 22, 2011
Applied Materials Israel, Ltd.
Dror Shemesh
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
TIME-DOMAIN OPTICAL METROLOGY AND INSPECTION OF SEMICONDUCTOR DEVICES
Publication number
20220390858
Publication date
Dec 8, 2022
NOVA LTD
GILAD BARAK
G01 - MEASURING TESTING
Information
Patent Application
TIME-DOMAIN OPTICAL METROLOGY AND INSPECTION OF SEMICONDUCTOR DEVICES
Publication number
20210247699
Publication date
Aug 12, 2021
NOVA MEASURING INSTRUMENTS LTD.
GILAD BARAK
G01 - MEASURING TESTING
Information
Patent Application
Method and System for Providing a Compensated Auger Spectrum
Publication number
20080234962
Publication date
Sep 25, 2008
Dror Shemesh
G01 - MEASURING TESTING