Yuri Vinshtein

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Hadera, IL

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Patents Grantslast 30 patents

Information Patent Grant
Small-angle X-ray scatterometry
- Patent number 12,085,521
- Issue date Sep 10, 2024
- BRUKER TECHNOLOGIES LTD.
- Alex Dikopoltsev
- G01 - MEASURING TESTING
Information Patent Grant
Small-angle x-ray scatterometry
- Patent number 11,703,464
- Issue date Jul 18, 2023
- BRUKER TECHNOLOGIES LTD.
- Alex Dikopoltsev
- G01 - MEASURING TESTING
Information Patent Grant
Small-angle x-ray scatterometry
- Patent number 11,181,490
- Issue date Nov 23, 2021
- BRUKER TECHNOLOGIES LTD.
- Alex Dikopoltsev
- G01 - MEASURING TESTING
Information Patent Grant
X-ray source optics for small-angle X-ray scatterometry
- Patent number 10,976,268
- Issue date Apr 13, 2021
- BRUKER TECHNOLOGIES LTD.
- Matthew Wormington
- G01 - MEASURING TESTING
Information Patent Grant
Wafer alignment for small-angle x-ray scatterometry
- Patent number 10,976,269
- Issue date Apr 13, 2021
- BRUKER TECHNOLOGIES LTD.
- Yuri Vinshtein
- G01 - MEASURING TESTING
Information Patent Grant
Closed-loop control of X-ray knife edge
- Patent number 10,386,313
- Issue date Aug 20, 2019
- BRUKER JV ISRAEL LTD.
- Isaac Mazor
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Small-Angle X-Ray Scatterometry
- Publication number 20240377342
- Publication date Nov 14, 2024
- BRUKER TECHNOLOGIES LTD.
- Alex Dikopoltsev
- G01 - MEASURING TESTING
Information Patent Application
Small-angle x-ray scatterometry
- Publication number 20240077435
- Publication date Mar 7, 2024
- BRUKER TECHNOLOGIES LTD.
- Alex Dikopoltsev
- G01 - MEASURING TESTING
Information Patent Application
Small-Angle X-Ray Scatterometry
- Publication number 20220042933
- Publication date Feb 10, 2022
- BRUKER TECHNOLOGIES LTD.
- Alex Dikopoltsev
- G01 - MEASURING TESTING
Information Patent Application
Small-angle x-ray scatterometry
- Publication number 20210285898
- Publication date Sep 16, 2021
- BRUKER TECHNOLOGIES LTD.
- Alex Dikopoltsev
- G01 - MEASURING TESTING
Information Patent Application
X-ray source optics for small-angle X-ray scatterometry
- Publication number 20190323975
- Publication date Oct 24, 2019
- BRUKER JV ISRAEL LTD.
- Matthew Wormington
- G01 - MEASURING TESTING
Information Patent Application
Wafer alignment for small-angle X-ray scatterometry
- Publication number 20190323976
- Publication date Oct 24, 2019
- BRUKER JV ISRAEL LTD.
- Yuri Vinshtein
- G01 - MEASURING TESTING
Information Patent Application
Closed-loop control of X-ray knife edge
- Publication number 20180088062
- Publication date Mar 29, 2018
- BRUKER JV ISRAEL LTD.
- Isaac Mazor
- G01 - MEASURING TESTING