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Yuri Vorobyev
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San Carlos, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Method of synthesizing a solid-state electrolyte for use in a lithi...
Patent number
11,817,550
Issue date
Nov 14, 2023
Ali Sadeghi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of manufacturing a solid-state lithium battery and a battery...
Patent number
11,817,570
Issue date
Nov 14, 2023
Ali Sadeghi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for precision measurement of film thickness
Patent number
6,989,675
Issue date
Jan 24, 2006
MultiMetrixs L.L.C.
Boris Kesil
G01 - MEASURING TESTING
Information
Patent Grant
System and method for measuring characteristics of materials with t...
Patent number
6,891,380
Issue date
May 10, 2005
Multimetrixs, LLC
Boris Kesil
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for multiple identical continuous records of c...
Patent number
6,842,025
Issue date
Jan 11, 2005
MultiMetrixs L.L.C.
Elik Gershenzon
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for measuring thickness of thin films with imp...
Patent number
6,815,958
Issue date
Nov 9, 2004
Multimetrixs, LLC
Boris Kesil
G01 - MEASURING TESTING
Information
Patent Grant
Universal electromagnetic resonance system for detecting and measur...
Patent number
6,801,044
Issue date
Oct 5, 2004
Boris Kesil
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD OF MANUFACTURING A SOLID-STATE LITHIUM BATTERY AND A BATTERY...
Publication number
20230044416
Publication date
Feb 9, 2023
Ali Sadeghi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Solid-State Electrolyte for Lithium-Ion Battery and a Method of Syn...
Publication number
20220344701
Publication date
Oct 27, 2022
Ali Sadeghi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method of Manufacturing Electrode Materials by Using Treated Carbon...
Publication number
20210126238
Publication date
Apr 29, 2021
Ali Sadeghi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method and apparatus for measuring temperature with the use of an i...
Publication number
20060056488
Publication date
Mar 16, 2006
Boris Surname
G01 - MEASURING TESTING
Information
Patent Application
System and method for measuring characteriscs of materials with the...
Publication number
20040239336
Publication date
Dec 2, 2004
Boris Kesil
G01 - MEASURING TESTING
Information
Patent Application
Method and system for measuring thickness of thin films with automa...
Publication number
20040227524
Publication date
Nov 18, 2004
Boris Kesil
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for precision measurement of film thickness
Publication number
20040178343
Publication date
Sep 16, 2004
Boris Kesil
G01 - MEASURING TESTING
Information
Patent Application
Apparatus and method for muliple identical continuous records of ch...
Publication number
20040158426
Publication date
Aug 12, 2004
Elik Gershenzon
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for measuring thickness of thin films with imp...
Publication number
20040155666
Publication date
Aug 12, 2004
Boris Kesil
G01 - MEASURING TESTING
Information
Patent Application
UNIVERSAL ELECTROMAGNETIC RESONANCE SYSTEM FOR DETECTING AND MEASUR...
Publication number
20040155667
Publication date
Aug 12, 2004
Boris Kesil
G01 - MEASURING TESTING