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Yuriy M. Barabash
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Kyiv, UA
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last 30 patents
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Patent Application
INTERFEROMETRY-BASED STRESS ANALYSIS
Publication number
20130003152
Publication date
Jan 3, 2013
United Technologies Corporation
Igor V. Belousov
G01 - MEASURING TESTING
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Patent Application
Electron beam physical vapor deposition apparatus and processes for...
Publication number
20080160171
Publication date
Jul 3, 2008
United Technologies Corporation
Yuriy M. Barabash
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...