Yuriy Platonov

Person

Troy, MI, US

People

Patents Grantslast 30 patents

Information Patent Grant
Imaging type X-ray microscope
- Patent number 11,885,753
- Issue date Jan 30, 2024
- Rigaku Corporation
- Kazuhiko Omote
- G01 - MEASURING TESTING
Information Patent Grant
Total reflection x-ray fluorescence spectrometer
- Patent number 11,867,646
- Issue date Jan 9, 2024
- Rigaku Corporation
- Makoto Kambe
- G01 - MEASURING TESTING
Information Patent Grant
X-ray diffractometer with multilayer reflection-type monochromator
- Patent number 10,436,723
- Issue date Oct 8, 2019
- Rigaku Corporation
- Takeshi Osakabe
- G01 - MEASURING TESTING
Information Patent Grant
Multiconfiguration X-ray optical system
- Patent number 8,249,220
- Issue date Aug 21, 2012
- Rigaku Innovative Technologies, Inc.
- Boris Verman
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Magnesium silicide-based multilayer x-ray fluorescence analyzers
- Patent number 7,848,483
- Issue date Dec 7, 2010
- Rigaku Innovative Technologies
- Yuriy Y. Platonov
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Multi-layer structure with variable bandpass for monochromatization...
- Patent number 6,809,864
- Issue date Oct 26, 2004
- Osmic, Inc.
- Vladimir V. Martynov
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray phase contrast imaging using a fabry-perot interferometer con...
- Patent number 6,804,324
- Issue date Oct 12, 2004
- Osmo, Inc.
- Vladimir V. Martynov
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Method and apparatus for detecting boron in x-ray fluorescence spec...
- Patent number 6,763,086
- Issue date Jul 13, 2004
- Osmic, Inc.
- Yuriy Platonov
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Protective layer for multilayers exposed to x-rays
- Patent number 6,643,353
- Issue date Nov 4, 2003
- Osmic, Inc.
- Boris Verman
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Multi-layer structure with variable bandpass for monochromatization...
- Patent number 6,510,200
- Issue date Jan 21, 2003
- Osmic, Inc.
- Vladimir V. Martynov
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING

Patents Applicationslast 30 patents

Information Patent Application
TOTAL REFLECTION X-RAY FLUORESCENCE SPECTROMETER
- Publication number 20230400423
- Publication date Dec 14, 2023
- Rigaku Corporation
- Makoto KAMBE
- G01 - MEASURING TESTING
Information Patent Application
IMAGING TYPE X-RAY MICROSCOPE
- Publication number 20220128487
- Publication date Apr 28, 2022
- Rigaku Corporation
- Kazuhiko OMOTE
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DIFFRACTOMETER
- Publication number 20170191950
- Publication date Jul 6, 2017
- Rigaku Corporation
- Takeshi OSAKABE
- G01 - MEASURING TESTING
Information Patent Application
Multiconfiguration X-ray Optical System
- Publication number 20110085644
- Publication date Apr 14, 2011
- Rigaku Innovative Technology
- Boris Verman
- B82 - NANO-TECHNOLOGY
Information Patent Application
MAGNESIUM SILICIDE-BASED MULTILAYER X-RAY FLUORESCENCE ANALYZERS
- Publication number 20090225937
- Publication date Sep 10, 2009
- YURIY Y. PLATONOV
- B82 - NANO-TECHNOLOGY
Information Patent Application
Method and apparatus for detecting boron in x-ray fluorescence spec...
- Publication number 20040047446
- Publication date Mar 11, 2004
- Yuriy Platonov
- G01 - MEASURING TESTING
Information Patent Application
PROTECTIVE LAYER FOR MULTILAYERS EXPOSED TO X-RAYS
- Publication number 20030128810
- Publication date Jul 10, 2003
- Osmic, Inc.
- Boris Verman
- B82 - NANO-TECHNOLOGY
Information Patent Application
Multi-layer structure with variable bandpass for monochromatization...
- Publication number 20030072412
- Publication date Apr 17, 2003
- Osmic, Inc.
- Vladimir V. Martynov
- G02 - OPTICS
Information Patent Application
MULTI-LAYER STRUCTURE WITH VARIABLE BANDPASS FOR MONOCHROMATIZATION...
- Publication number 20030002622
- Publication date Jan 2, 2003
- Osmic, Inc.
- Vladimir V. Martynov
- B82 - NANO-TECHNOLOGY
Information Patent Application
X-RAY PHASE CONTRAST IMAGING USING A FABRY-PEROT INTERFEROMETER CON...
- Publication number 20020150204
- Publication date Oct 17, 2002
- Vladimir V. Martynov
- B82 - NANO-TECHNOLOGY

Yuriy Platonov

Person

Patents Grantslast 30 patents

Imaging type X-ray microscope

Total reflection x-ray fluorescence spectrometer

X-ray diffractometer with multilayer reflection-type monochromator

Multiconfiguration X-ray optical system

Magnesium silicide-based multilayer x-ray fluorescence analyzers

Multi-layer structure with variable bandpass for monochromatization...

X-ray phase contrast imaging using a fabry-perot interferometer con...

Method and apparatus for detecting boron in x-ray fluorescence spec...

Protective layer for multilayers exposed to x-rays

Multi-layer structure with variable bandpass for monochromatization...

Patents Applicationslast 30 patents

TOTAL REFLECTION X-RAY FLUORESCENCE SPECTROMETER

IMAGING TYPE X-RAY MICROSCOPE

X-RAY DIFFRACTOMETER

Multiconfiguration X-ray Optical System

MAGNESIUM SILICIDE-BASED MULTILAYER X-RAY FLUORESCENCE ANALYZERS

Method and apparatus for detecting boron in x-ray fluorescence spec...

PROTECTIVE LAYER FOR MULTILAYERS EXPOSED TO X-RAYS

Multi-layer structure with variable bandpass for monochromatization...

MULTI-LAYER STRUCTURE WITH VARIABLE BANDPASS FOR MONOCHROMATIZATION...

X-RAY PHASE CONTRAST IMAGING USING A FABRY-PEROT INTERFEROMETER CON...