Yury Yuditsky

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Mountain View, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
System and method for compensation of illumination beam misalignment
- Patent number 10,495,579
- Issue date Dec 3, 2019
- KLA-Tencor Corporation
- Frank Li
- G01 - MEASURING TESTING
Information Patent Grant
Wafer inspection
- Patent number 10,488,348
- Issue date Nov 26, 2019
- KLA-Tencor Corp.
- Anatoly Romanovsky
- G01 - MEASURING TESTING
Information Patent Grant
Wafer inspection
- Patent number 9,915,622
- Issue date Mar 13, 2018
- KLA-Tencor Corp.
- Anatoly Romanovsky
- G01 - MEASURING TESTING
Information Patent Grant
Scanning inspection system with angular correction
- Patent number 9,587,936
- Issue date Mar 7, 2017
- KLA-Tencor Corporation
- Yury Yuditsky
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for high speed acquisition of moving images us...
- Patent number 9,426,400
- Issue date Aug 23, 2016
- KLA-Tencor Corporation
- David L. Brown
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Wafer inspection
- Patent number 9,279,774
- Issue date Mar 8, 2016
- KLA-Tencor Corp.
- Anatoly Romanovsky
- G01 - MEASURING TESTING
Information Patent Grant
Extended defect sizing range for wafer inspection
- Patent number 9,091,666
- Issue date Jul 28, 2015
- KLA-Tencor Corp.
- Zhongping Cai
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Wafer Inspection
- Publication number 20180164228
- Publication date Jun 14, 2018
- KLA-Tencor Corporation
- Anatoly Romanovsky
- G01 - MEASURING TESTING
Information Patent Application
System and Method for Compensation of Illumination Beam Misalignment
- Publication number 20170336329
- Publication date Nov 23, 2017
- KLA-Tencor Corporation
- Frank Li
- G01 - MEASURING TESTING
Information Patent Application
Wafer Inspection
- Publication number 20150369753
- Publication date Dec 24, 2015
- KLA-Tencor Corporation
- Anatoly Romanovsky
- G01 - MEASURING TESTING
Information Patent Application
Scanning Inspection System With Angular Correction
- Publication number 20140278188
- Publication date Sep 18, 2014
- Yury Yuditsky
- G01 - MEASURING TESTING
Information Patent Application
Method And Apparatus For High Speed Acquisition Of Moving Images Us...
- Publication number 20140158864
- Publication date Jun 12, 2014
- KLA-Tencor Corporation
- David L. Brown
- G01 - MEASURING TESTING
Information Patent Application
Extended Defect Sizing Range for Wafer Inspection
- Publication number 20130208269
- Publication date Aug 15, 2013
- KLA-Tencor Corporation
- Zhongping Cai
- G01 - MEASURING TESTING
Information Patent Application
Wafer Inspection
- Publication number 20130016346
- Publication date Jan 17, 2013
- KLA-Tencor Corporation
- Anatoly Romanovsky
- G01 - MEASURING TESTING