Yusaku Ito

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device and power converter
- Patent number 11,677,312
- Issue date Jun 13, 2023
- Mitsubishi Electric Corporation
- Yusaku Ito
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Testing apparatus
- Patent number 11,474,143
- Issue date Oct 18, 2022
- Disco Corporation
- Makoto Kobayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measuring apparatus for measuring a flexural strength of a test piece
- Patent number 11,402,310
- Issue date Aug 2, 2022
- Disco Corporation
- Yoshinobu Saito
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detecting facet region, wafer producing me...
- Patent number 11,340,163
- Issue date May 24, 2022
- Disco Corporation
- Yusaku Ito
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ultrafast imaging apparatus
- Patent number 11,032,456
- Issue date Jun 8, 2021
- Disco Corporation
- Keiji Nomaru
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Semiconductor module, method for manufacturing semiconductor module...
- Patent number 10,930,616
- Issue date Feb 23, 2021
- Mitsubishi Electric Corporation
- Yusaku Ito
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor module and method for manufacturing the same
- Patent number 10,643,969
- Issue date May 5, 2020
- Mitsubishi Electric Corporation
- Yusaku Ito
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fluorescence detecting apparatus
- Patent number 9,989,468
- Issue date Jun 5, 2018
- Disco Corporation
- Yusaku Ito
- G01 - MEASURING TESTING
Information Patent Grant
Protective film detecting method
- Patent number 9,976,951
- Issue date May 22, 2018
- Disco Corporation
- Senichi Ryo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer inspection method and wafer inspection apparatus
- Patent number 9,953,407
- Issue date Apr 24, 2018
- Disco Corporation
- Yusaku Ito
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Laser processing apparatus
- Patent number 9,895,768
- Issue date Feb 20, 2018
- Disco Corporation
- Junichi Kuki
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Wafer processing method
- Patent number 9,881,828
- Issue date Jan 30, 2018
- Disco Corporation
- Shinji Yoshida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Processing apparatus including a three-dimensional interferometric...
- Patent number 9,791,411
- Issue date Oct 17, 2017
- Disco Corporation
- Yusaku Ito
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Laser beam spot shape detection method
- Patent number 9,789,567
- Issue date Oct 17, 2017
- Disco Corporation
- Kenji Asano
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Wafer inspection method and grinding and polishing apparatus
- Patent number 9,616,544
- Issue date Apr 11, 2017
- Disco Corporation
- Yusaku Ito
- B24 - GRINDING POLISHING
Information Patent Grant
Protective film detecting apparatus and protective film detecting m...
- Patent number 9,613,415
- Issue date Apr 4, 2017
- Disco Corporation
- Yu Kudo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical device and laser beam machining apparatus having optical de...
- Patent number 8,569,649
- Issue date Oct 29, 2013
- Disco Corporation
- Yusaku Ito
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
SOLID ELECTROLYTE CAPACITOR AND METHOD FOR MANUFACTURING SAME
- Publication number 20230154689
- Publication date May 18, 2023
- NIPPON CHEMI-CON CORPORATION
- Kenta Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR DETECTING FACET REGION, WAFER PRODUCING ME...
- Publication number 20220236185
- Publication date Jul 28, 2022
- Disco Corporation
- Yusaku ITO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND POWER CONVERTER
- Publication number 20210048472
- Publication date Feb 18, 2021
- Mitsubishi Electric Corporation
- Yusaku ITO
- G01 - MEASURING TESTING
Information Patent Application
MEASURING APPARATUS
- Publication number 20200371005
- Publication date Nov 26, 2020
- Disco Corporation
- Yoshinobu SAITO
- G01 - MEASURING TESTING
Information Patent Application
ULTRAFAST IMAGING APPARATUS
- Publication number 20200322510
- Publication date Oct 8, 2020
- Disco Corporation
- Keiji NOMARU
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
TESTING APPARATUS
- Publication number 20200182923
- Publication date Jun 11, 2020
- Disco Corporation
- Makoto KOBAYASHI
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR DETECTING FACET REGION, WAFER PRODUCING ME...
- Publication number 20200150038
- Publication date May 14, 2020
- Disco Corporation
- Yusaku ITO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR MODULE, METHOD FOR MANUFACTURING SEMICONDUCTOR MODULE...
- Publication number 20200035639
- Publication date Jan 30, 2020
- MITSUBISHI ELECTRIC CORPORATION
- Yusaku ITO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR MODULE AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20190043827
- Publication date Feb 7, 2019
- MITSUBISHI ELECTRIC CORPORATION
- Yusaku ITO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FLUORESCENCE DETECTING APPARATUS
- Publication number 20170370845
- Publication date Dec 28, 2017
- Disco Corporation
- Yusaku Ito
- G01 - MEASURING TESTING
Information Patent Application
WAFER PROCESSING METHOD
- Publication number 20170213756
- Publication date Jul 27, 2017
- Disco Corporation
- Shinji Yoshida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROTECTIVE FILM DETECTING METHOD
- Publication number 20160266037
- Publication date Sep 15, 2016
- Disco Corporation
- Senichi Ryo
- G01 - MEASURING TESTING
Information Patent Application
PROTECTIVE FILM DETECTING APPARATUS AND PROTECTIVE FILM DETECTING M...
- Publication number 20160125591
- Publication date May 5, 2016
- Disco Corporation
- Yu Kudo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WAFER INSPECTION METHOD AND WAFER INSPECTION APPARATUS
- Publication number 20160098828
- Publication date Apr 7, 2016
- Disco Corporation
- Yusaku Ito
- G01 - MEASURING TESTING
Information Patent Application
LASER PROCESSING APPARATUS
- Publication number 20160067819
- Publication date Mar 10, 2016
- Disco Corporation
- Junichi Kuki
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
WAFER INSPECTION METHOD AND GRINDING AND POLISHING APPARATUS
- Publication number 20160059375
- Publication date Mar 3, 2016
- Disco Corporation
- Yusaku Ito
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LASER BEAM SPOT SHAPE DETECTION METHOD
- Publication number 20160045980
- Publication date Feb 18, 2016
- Disco Corporation
- Kenji Asano
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
OPTICAL DEVICE AND MANUFACTURING METHOD THEREFOR
- Publication number 20150214432
- Publication date Jul 30, 2015
- Disco Corporation
- Naotoshi Kirihara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROCESSING APPARATUS
- Publication number 20150049171
- Publication date Feb 19, 2015
- Disco Corporation
- Yusaku Ito
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DEVICE AND LASER BEAM MACHINING APPARATUS HAVING OPTICAL DE...
- Publication number 20120018412
- Publication date Jan 26, 2012
- Disco Corporation
- Yusaku ITO
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR

Person

Patents Grantslast 30 patents

Semiconductor device and power converter

Testing apparatus

Measuring apparatus for measuring a flexural strength of a test piece

Method and apparatus for detecting facet region, wafer producing me...

Ultrafast imaging apparatus

Semiconductor module, method for manufacturing semiconductor module...

Semiconductor module and method for manufacturing the same

Fluorescence detecting apparatus

Protective film detecting method

Wafer inspection method and wafer inspection apparatus

Laser processing apparatus

Wafer processing method

Processing apparatus including a three-dimensional interferometric...

Laser beam spot shape detection method

Wafer inspection method and grinding and polishing apparatus

Protective film detecting apparatus and protective film detecting m...

Optical device and laser beam machining apparatus having optical de...

Patents Applicationslast 30 patents

SOLID ELECTROLYTE CAPACITOR AND METHOD FOR MANUFACTURING SAME

METHOD AND APPARATUS FOR DETECTING FACET REGION, WAFER PRODUCING ME...

SEMICONDUCTOR DEVICE AND POWER CONVERTER

MEASURING APPARATUS

ULTRAFAST IMAGING APPARATUS

TESTING APPARATUS

METHOD AND APPARATUS FOR DETECTING FACET REGION, WAFER PRODUCING ME...

SEMICONDUCTOR MODULE, METHOD FOR MANUFACTURING SEMICONDUCTOR MODULE...

SEMICONDUCTOR MODULE AND METHOD FOR MANUFACTURING THE SAME

FLUORESCENCE DETECTING APPARATUS

WAFER PROCESSING METHOD

PROTECTIVE FILM DETECTING METHOD

PROTECTIVE FILM DETECTING APPARATUS AND PROTECTIVE FILM DETECTING M...

WAFER INSPECTION METHOD AND WAFER INSPECTION APPARATUS

LASER PROCESSING APPARATUS

WAFER INSPECTION METHOD AND GRINDING AND POLISHING APPARATUS

LASER BEAM SPOT SHAPE DETECTION METHOD

OPTICAL DEVICE AND MANUFACTURING METHOD THEREFOR

PROCESSING APPARATUS

OPTICAL DEVICE AND LASER BEAM MACHINING APPARATUS HAVING OPTICAL DE...