Yusaku Konno

Person

Kanagawa, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Pattern inspection method and pattern inspection apparatus
- Patent number 9,176,074
- Issue date Nov 3, 2015
- Kabushiki Kaisha Toshiba
- Takayoshi Fujii
- G01 - MEASURING TESTING
Information Patent Grant
Solid-state imaging device
- Patent number 9,059,055
- Issue date Jun 16, 2015
- Kabushiki Kaisha Toshiba
- Yusaku Konno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Solid-state imaging device and manufacturing method of solid-state...
- Patent number 8,963,267
- Issue date Feb 24, 2015
- Kabushiki Kaisha Toshiba
- Koichi Kokubun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing an apodizer, and optical module
- Patent number 8,953,249
- Issue date Feb 10, 2015
- Kabushiki Kaisha Toshiba
- Minoru Inomoto
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Solid-state imaging element
- Patent number 8,890,984
- Issue date Nov 18, 2014
- Kabushiki Kaisha Toshiba
- Yusaku Konno
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Solid-state image sensor
- Patent number 8,823,123
- Issue date Sep 2, 2014
- Kabushiki Kaisha Toshiba
- Koichi Kokubun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Solid-state imaging device
- Patent number 8,759,929
- Issue date Jun 24, 2014
- Kabushiki Kaisha Toshiba
- Kazufumi Shiozawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pattern inspection apparatus and pattern inspection method
- Patent number 8,649,591
- Issue date Feb 11, 2014
- Kabushiki Kaisha Toshiba
- Makoto Kaneko
- G01 - MEASURING TESTING
Information Patent Grant
Solid-state imaging device and method for manufacturing same
- Patent number 8,648,435
- Issue date Feb 11, 2014
- Kabushiki Kaisha Toshiba
- Yusaku Konno
- G02 - OPTICS
Information Patent Grant
Pattern inspection apparatus and pattern inspection method
- Patent number 8,502,988
- Issue date Aug 6, 2013
- Kabushiki Kaisha Toshiba
- Yusaku Konno
- G01 - MEASURING TESTING
Information Patent Grant
Array-type light receiving device and light collection method
- Patent number 7,868,285
- Issue date Jan 11, 2011
- Kabushiki Kaisha Toshiba
- Yusaku Konno
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
LASER HEATING TREATMENT METHOD AND METHOD FOR MANUFACTURING SOLID-S...
- Publication number 20150255665
- Publication date Sep 10, 2015
- KABUSHIKI KAISHA TOSHIBA
- Hiroyuki FUKUMIZU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PATTERN INSPECTION METHOD AND PATTERN INSPECTION APPARATUS
- Publication number 20140212023
- Publication date Jul 31, 2014
- KABUSHIKI KAISHA TOSHIBA
- Takayoshi FUJII
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MANUFACTURING AN APODIZER, AND OPTICAL MODULE
- Publication number 20130329303
- Publication date Dec 12, 2013
- Kabushiki Kaisha Toshiba
- Minoru INOMOTO
- G02 - OPTICS
Information Patent Application
SOLID-STATE IMAGING DEVICE
- Publication number 20130200480
- Publication date Aug 8, 2013
- Kabushiki Kaisha Toshiba
- Yusaku KONNO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SOLID-STATE IMAGE SENSOR
- Publication number 20130154041
- Publication date Jun 20, 2013
- KABUSHIKI KAISHA TOSHIBA
- Koichi KOKUBUN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SOLID-STATE IMAGING DEVICE AND MANUFACTURING METHOD OF SOLID-STATE...
- Publication number 20130093034
- Publication date Apr 18, 2013
- KABUSHIKI KAISHA TOSHIBA
- Koichi KOKUBUN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PATTERN INSPECTION APPARATUS AND METHOD
- Publication number 20130063721
- Publication date Mar 14, 2013
- Kabushiki Kaisha Toshiba
- Takayoshi FUJII
- G01 - MEASURING TESTING
Information Patent Application
SOLID-STATE IMAGING ELEMENT
- Publication number 20130057738
- Publication date Mar 7, 2013
- Kabushiki Kaisha Toshiba
- Yusaku Konno
- G02 - OPTICS
Information Patent Application
SOLID STATE IMAGING DEVICE AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20130032915
- Publication date Feb 7, 2013
- Kabushiki Kaisha Toshiba
- Junichi TONOTANI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD
- Publication number 20120242985
- Publication date Sep 27, 2012
- Kabushiki Kaisha Toshiba
- Mitsutoshi WATABIKI
- G01 - MEASURING TESTING
Information Patent Application
PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD
- Publication number 20120243770
- Publication date Sep 27, 2012
- Kabushiki Kaisha Toshiba
- Makoto Kaneko
- G01 - MEASURING TESTING
Information Patent Application
PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD
- Publication number 20120242995
- Publication date Sep 27, 2012
- Kabushiki Kaisha Toshiba
- Yusaku KONNO
- G01 - MEASURING TESTING
Information Patent Application
PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD
- Publication number 20110063621
- Publication date Mar 17, 2011
- Kabushiki Kaisha Toshiba
- Yusaku KONNO
- G01 - MEASURING TESTING
Information Patent Application
SOLID-STATE IMAGING DEVICE AND METHOD FOR MANUFACTURING SAME
- Publication number 20100244167
- Publication date Sep 30, 2010
- Kabushiki Kaisha Toshiba
- Yusaku KONNO
- G02 - OPTICS
Information Patent Application
SOLID-STATE IMAGING DEVICE
- Publication number 20100244168
- Publication date Sep 30, 2010
- Kabushiki Kaisha Toshiba
- Kazufumi SHIOZAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGING DEVICE AND METHOD FOR MANUFACTURING SAME, AND IMAGING METHOD
- Publication number 20100224760
- Publication date Sep 9, 2010
- Kabushiki Kaisha Toshiba
- Yusaku KONNO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ARRAY-TYPE LIGHT RECEIVING DEVICE AND LIGHT COLLECTION METHOD
- Publication number 20080315074
- Publication date Dec 25, 2008
- Kabushiki Kaisha Toshiba
- Yusaku KONNO
- G02 - OPTICS

Yusaku Konno

Person

Patents Grantslast 30 patents

Pattern inspection method and pattern inspection apparatus

Solid-state imaging device

Solid-state imaging device and manufacturing method of solid-state...

Method of manufacturing an apodizer, and optical module

Solid-state imaging element

Solid-state image sensor

Solid-state imaging device

Pattern inspection apparatus and pattern inspection method

Solid-state imaging device and method for manufacturing same

Pattern inspection apparatus and pattern inspection method

Array-type light receiving device and light collection method

Patents Applicationslast 30 patents

LASER HEATING TREATMENT METHOD AND METHOD FOR MANUFACTURING SOLID-S...

PATTERN INSPECTION METHOD AND PATTERN INSPECTION APPARATUS

METHOD OF MANUFACTURING AN APODIZER, AND OPTICAL MODULE

SOLID-STATE IMAGING DEVICE

SOLID-STATE IMAGE SENSOR

SOLID-STATE IMAGING DEVICE AND MANUFACTURING METHOD OF SOLID-STATE...

PATTERN INSPECTION APPARATUS AND METHOD

SOLID-STATE IMAGING ELEMENT

SOLID STATE IMAGING DEVICE AND METHOD FOR MANUFACTURING THE SAME

PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD

PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD

PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD

PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD

SOLID-STATE IMAGING DEVICE AND METHOD FOR MANUFACTURING SAME

SOLID-STATE IMAGING DEVICE

IMAGING DEVICE AND METHOD FOR MANUFACTURING SAME, AND IMAGING METHOD

ARRAY-TYPE LIGHT RECEIVING DEVICE AND LIGHT COLLECTION METHOD