Yushu SHI

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Beijing, CN

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Patents Grantslast 30 patents

Information Patent Grant
Composite measurement system for measuring nanometer displacement
- Patent number 12,174,017
- Issue date Dec 24, 2024
- National Institute of Metrology, China
- Yushu Shi
- G01 - MEASURING TESTING
Information Patent Grant
Surface texture probe and measurement apparatus with a vibrational...
- Patent number 11,709,045
- Issue date Jul 25, 2023
- National Institute of Metrology, China
- Yushu Shi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
COMPOSITE MEASUREMENT SYSTEM FOR MEASURING NANOMETER DISPLACEMENT
- Publication number 20220412719
- Publication date Dec 29, 2022
- NATIONAL INSTITUTE OF METROLOGY, CHINA
- Yushu SHI
- G01 - MEASURING TESTING