Yusin Yang

Person

Seoul, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Test apparatus and test method thereof
- Patent number 12,092,656
- Issue date Sep 17, 2024
- Samsung Electronics Co., Ltd.
- Sungyoon Ryu
- G01 - MEASURING TESTING
Information Patent Grant
Substrate inspection method and method of fabricating a semiconduct...
- Patent number 11,486,834
- Issue date Nov 1, 2022
- Samsung Electronics Co., Ltd.
- Younghoon Sohn
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of inspecting semiconductor wafer, inspection system for per...
- Patent number 11,004,712
- Issue date May 11, 2021
- Samsung Electronics Co., Ltd.
- Sung Yoon Ryu
- G01 - MEASURING TESTING
Information Patent Grant
Mass flow controller, apparatus for manufacturing semiconductor dev...
- Patent number 10,845,232
- Issue date Nov 24, 2020
- Samsung Electronics Co., Ltd.
- Sangkil Lee
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring misalignment of chips, a method of fabricating...
- Patent number 10,720,365
- Issue date Jul 21, 2020
- Samsung Electronics Co., Ltd.
- Younghoon Sohn
- G01 - MEASURING TESTING
Information Patent Grant
Inspection method, inspection system, and method of manufacturing s...
- Patent number 10,482,593
- Issue date Nov 19, 2019
- Samsung Electronics Co., Ltd.
- Younghoon Sohn
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection method, inspection system, and method of fabricating sem...
- Patent number 10,460,436
- Issue date Oct 29, 2019
- Samsung Electronics Co., Ltd.
- Younghoon Sohn
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method of inspecting substrate and method of fabricating...
- Patent number 10,393,672
- Issue date Aug 27, 2019
- Samsung Electronics Co., Ltd.
- Jeongho Ahn
- G01 - MEASURING TESTING
Information Patent Grant
Method of inspecting semiconductor wafer, an inspection system for...
- Patent number 10,269,111
- Issue date Apr 23, 2019
- Samsung Electronics Co., Ltd.
- Joonseo Song
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for measuring thickness
- Patent number 10,088,297
- Issue date Oct 2, 2018
- Samsung Electronics Co., Ltd.
- Sung Yoon Ryu
- G01 - MEASURING TESTING
Information Patent Grant
Fan-out panel level package and method of fabricating the same
- Patent number 9,892,980
- Issue date Feb 13, 2018
- Samsung Electronics Co., Ltd.
- Younghoon Sohn
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing a semiconductor device using semiconductor...
- Patent number 9,583,402
- Issue date Feb 28, 2017
- Samsung Electronics Co., Ltd.
- Sung Yoon Ryu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of inspecting semiconductor device and method of fabricating...
- Patent number 9,466,537
- Issue date Oct 11, 2016
- Samsung Electronics Co., Ltd.
- Minkook Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor inspection system and methods of inspecting a semicon...
- Patent number 9,455,121
- Issue date Sep 27, 2016
- Samsung Electronics Co., Ltd.
- Hyunwoo Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and apparatuses for inspecting semiconductor devices using...
- Patent number 9,267,903
- Issue date Feb 23, 2016
- Samsung Electronics Co., Ltd.
- Mira Park
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MATERIAL MEASUREMENT SYSTEM AND METHOD
- Publication number 20250003734
- Publication date Jan 2, 2025
- Samsung Electronics Co., Ltd.
- Sungyoon Ryu
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS AND TEST METHOD THEREOF
- Publication number 20240385220
- Publication date Nov 21, 2024
- Sungyoon RYU
- G01 - MEASURING TESTING
Information Patent Application
TERAHERTZ SIGNAL MEASURING APPARATUS AND MEASURING METHOD
- Publication number 20240230528
- Publication date Jul 11, 2024
- Samsung Electronics Co., Ltd.
- Sunhong Jun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF INSPECTING TIP OF ATOMIC FORCE MICROSCOPE AND METHOD OF M...
- Publication number 20230194567
- Publication date Jun 22, 2023
- Samsung Electronics Co., Ltd.
- Kwangeun Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER INSPECTION APPARATUS USING THREE-DIMENSIONAL IMAGE AND METHOD...
- Publication number 20230184691
- Publication date Jun 15, 2023
- Samsung Electronics Co., Ltd.
- Yusin YANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LIGHT DETECTION AND RANGING (LiDAR)-BASED INSPECTION DEVICE AND MET...
- Publication number 20230108333
- Publication date Apr 6, 2023
- Samsung Electronics Co., Ltd.
- Sungyoon RYU
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS AND TEST METHOD THEREOF
- Publication number 20220404395
- Publication date Dec 22, 2022
- Korea Advanced Institute of Science and Technology
- Sungyoon RYU
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE INSPECTION DEVICE
- Publication number 20210140899
- Publication date May 13, 2021
- Samsung Electronics Co., Ltd.
- Jangik PARK
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE INSPECTION METHOD AND METHOD OF FABRICATING A SEMICONDUCT...
- Publication number 20200209165
- Publication date Jul 2, 2020
- Samsung Electronics Co., Ltd.
- Younghoon SOHN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPECTROSCOPIC SYSTEM, OPTICAL INSPECTION METHOD, AND SEMICONDUCTOR...
- Publication number 20200194294
- Publication date Jun 18, 2020
- Samsung Electronics Co., Ltd.
- SUNGHO JANG
- G01 - MEASURING TESTING
Information Patent Application
MEASURING APPARATUS AND SUBSTRATE ANALYSIS METHOD USING THE SAME
- Publication number 20200182783
- Publication date Jun 11, 2020
- Samsung Electronics Co., Ltd.
- Sunhong JUN
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF INSPECTING SEMICONDUCTOR WAFER, INSPECTION SYSTEM FOR PER...
- Publication number 20200176292
- Publication date Jun 4, 2020
- Samsung Electronics Co,Ltd.
- Sung Yoon RYU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MASS FLOW CONTROLLER, APPARATUS FOR MANUFACTURING SEMICONDUCTOR DEV...
- Publication number 20190170563
- Publication date Jun 6, 2019
- Samsung Electronics Co., Ltd.
- Sangkil Lee
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD OF INSPECTING SUBSTRATE AND METHOD OF FABRICATING...
- Publication number 20190033232
- Publication date Jan 31, 2019
- Samsung Electronics Co., Ltd.
- JEONGHO AHN
- G02 - OPTICS
Information Patent Application
INSPECTION METHOD, INSPECTION SYSTEM, AND METHOD OF FABRICATING SEM...
- Publication number 20180101940
- Publication date Apr 12, 2018
- Samsung Electronics Co., Ltd.
- Younghoon SOHN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FAN-OUT PANEL LEVEL PACKAGE AND METHOD OF FABRICATING THE SAME
- Publication number 20180096903
- Publication date Apr 5, 2018
- Samsung Electronics Co., Ltd.
- Younghoon Sohn
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF INSPECTING SEMICONDUCTOR WAFER, AN INSPECTION SYSTEM FOR...
- Publication number 20180053292
- Publication date Feb 22, 2018
- Samsung Electronics Co., Ltd.
- Joonseo Song
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF MEASURING MISALIGNMENT OF CHIPS, A METHOD OF FABRICATING...
- Publication number 20180025949
- Publication date Jan 25, 2018
- Samsung Electronics Co., Ltd.
- Younghoon SOHN
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION METHOD, INSPECTION SYSTEM, AND METHOD OF MANUFACTURING S...
- Publication number 20180005369
- Publication date Jan 4, 2018
- Samsung Electronics Co., Ltd.
- Younghoon SOHN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHOD FOR MEASURING THICKNESS
- Publication number 20170363418
- Publication date Dec 21, 2017
- Samsung Electronics Co., Ltd.
- Sung Yoon RYU
- G01 - MEASURING TESTING
Information Patent Application
FAN-OUT PANEL LEVEL PACKAGE AND METHOD OF FABRICATING THE SAME
- Publication number 20170309523
- Publication date Oct 26, 2017
- Samsung Electronics Co., Ltd.
- Younghoon SOHN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS OF INSPECTING SUBSTRATES AND SEMICONDUCTOR FABRICATION METH...
- Publication number 20170200658
- Publication date Jul 13, 2017
- Samsung Electronics Co., Ltd.
- Yusin Yang
- G01 - MEASURING TESTING
Information Patent Application
DATA COLLECTING/PROCESSING SYSTEM AND PRODUCT MANUFACTURING/ANALYZI...
- Publication number 20170083587
- Publication date Mar 23, 2017
- Samsung Electronics Co., Ltd.
- YEONJUNG KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF INSPECTING SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING...
- Publication number 20160204041
- Publication date Jul 14, 2016
- Samsung Electronics Co., Ltd.
- Minkook KIM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR INSPECTION SYSTEM AND METHODS OF INSPECTING A SEMICON...
- Publication number 20160086769
- Publication date Mar 24, 2016
- Hyunwoo KIM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE USING SEMICONDUCTOR...
- Publication number 20160027707
- Publication date Jan 28, 2016
- Samsung Electronics Co., Ltd.
- Sung Yoon RYU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND APPARATUSES FOR INSPECTING SEMICONDUCTOR DEVICES USING...
- Publication number 20140061462
- Publication date Mar 6, 2014
- Mira PARK
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Test apparatus and test method thereof

Substrate inspection method and method of fabricating a semiconduct...

Method of inspecting semiconductor wafer, inspection system for per...

Mass flow controller, apparatus for manufacturing semiconductor dev...

Method of measuring misalignment of chips, a method of fabricating...

Inspection method, inspection system, and method of manufacturing s...

Inspection method, inspection system, and method of fabricating sem...

System and method of inspecting substrate and method of fabricating...

Method of inspecting semiconductor wafer, an inspection system for...

Apparatus and method for measuring thickness

Fan-out panel level package and method of fabricating the same

Method of manufacturing a semiconductor device using semiconductor...

Method of inspecting semiconductor device and method of fabricating...

Semiconductor inspection system and methods of inspecting a semicon...

Methods and apparatuses for inspecting semiconductor devices using...

Patents Applicationslast 30 patents

MATERIAL MEASUREMENT SYSTEM AND METHOD

TEST APPARATUS AND TEST METHOD THEREOF

TERAHERTZ SIGNAL MEASURING APPARATUS AND MEASURING METHOD

METHOD OF INSPECTING TIP OF ATOMIC FORCE MICROSCOPE AND METHOD OF M...

WAFER INSPECTION APPARATUS USING THREE-DIMENSIONAL IMAGE AND METHOD...

LIGHT DETECTION AND RANGING (LiDAR)-BASED INSPECTION DEVICE AND MET...

TEST APPARATUS AND TEST METHOD THEREOF

SUBSTRATE INSPECTION DEVICE

SUBSTRATE INSPECTION METHOD AND METHOD OF FABRICATING A SEMICONDUCT...

SPECTROSCOPIC SYSTEM, OPTICAL INSPECTION METHOD, AND SEMICONDUCTOR...

MEASURING APPARATUS AND SUBSTRATE ANALYSIS METHOD USING THE SAME

METHOD OF INSPECTING SEMICONDUCTOR WAFER, INSPECTION SYSTEM FOR PER...

MASS FLOW CONTROLLER, APPARATUS FOR MANUFACTURING SEMICONDUCTOR DEV...

SYSTEM AND METHOD OF INSPECTING SUBSTRATE AND METHOD OF FABRICATING...

INSPECTION METHOD, INSPECTION SYSTEM, AND METHOD OF FABRICATING SEM...

FAN-OUT PANEL LEVEL PACKAGE AND METHOD OF FABRICATING THE SAME

METHOD OF INSPECTING SEMICONDUCTOR WAFER, AN INSPECTION SYSTEM FOR...

METHOD OF MEASURING MISALIGNMENT OF CHIPS, A METHOD OF FABRICATING...

INSPECTION METHOD, INSPECTION SYSTEM, AND METHOD OF MANUFACTURING S...

APPARATUS AND METHOD FOR MEASURING THICKNESS

FAN-OUT PANEL LEVEL PACKAGE AND METHOD OF FABRICATING THE SAME

METHODS OF INSPECTING SUBSTRATES AND SEMICONDUCTOR FABRICATION METH...

DATA COLLECTING/PROCESSING SYSTEM AND PRODUCT MANUFACTURING/ANALYZI...

METHOD OF INSPECTING SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING...

SEMICONDUCTOR INSPECTION SYSTEM AND METHODS OF INSPECTING A SEMICON...

METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE USING SEMICONDUCTOR...

METHODS AND APPARATUSES FOR INSPECTING SEMICONDUCTOR DEVICES USING...