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Yusuke Ebi
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Tokyo, JP
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last 30 patents
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Patent Grant
Optical axis orientation measuring device, optical axis orientation...
Patent number
7,965,395
Issue date
Jun 21, 2011
Yamatake Corporation
Yusuke Ebi
G01 - MEASURING TESTING
Information
Patent Grant
Method for detecting equatorial plane
Patent number
7,952,712
Issue date
May 31, 2011
Yamatake Corp.
Susumu Segawa
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
OPTICAL AXIS ORIENTATION MEASURING DEVICE, OPTICAL AXIS ORIENTATION...
Publication number
20090236170
Publication date
Sep 24, 2009
Yamatake Corporation
Yusuke Ebi
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR DETECTING EQUATORIAL PLANE
Publication number
20090237663
Publication date
Sep 24, 2009
Yamatake Corporation
Susumu Segawa
G01 - MEASURING TESTING