Yusuke Iida

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Yokkaichi-Shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Pattern inspection method and pattern inspection apparatus
- Patent number 9,176,074
- Issue date Nov 3, 2015
- Kabushiki Kaisha Toshiba
- Takayoshi Fujii
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DEFECT DETECTION METHOD
- Publication number 20150268177
- Publication date Sep 24, 2015
- KABUSHIKI KAISHA TOSHIBA
- Kaito YOKOCHI
- G01 - MEASURING TESTING
Information Patent Application
PATTERN INSPECTION METHOD AND PATTERN INSPECTION APPARATUS
- Publication number 20140212023
- Publication date Jul 31, 2014
- KABUSHIKI KAISHA TOSHIBA
- Takayoshi FUJII
- G01 - MEASURING TESTING
Information Patent Application
PATTERN INSPECTION APPARATUS AND METHOD
- Publication number 20130063721
- Publication date Mar 14, 2013
- Kabushiki Kaisha Toshiba
- Takayoshi FUJII
- G01 - MEASURING TESTING
Information Patent Application
PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD
- Publication number 20120242985
- Publication date Sep 27, 2012
- Kabushiki Kaisha Toshiba
- Mitsutoshi WATABIKI
- G01 - MEASURING TESTING
Information Patent Application
PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD
- Publication number 20120243770
- Publication date Sep 27, 2012
- Kabushiki Kaisha Toshiba
- Makoto Kaneko
- G01 - MEASURING TESTING
Information Patent Application
PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD
- Publication number 20120242995
- Publication date Sep 27, 2012
- Kabushiki Kaisha Toshiba
- Yusaku KONNO
- G01 - MEASURING TESTING