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Yusuke Iida

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  • Ayabe-shi, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Sensor device and detection method
    • Patent number 12,181,577
    • Issue date Dec 31, 2024
    • Omron Corporation
    • Shoichi Ohnaka
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sensor system
    • Patent number 11,774,464
    • Issue date Oct 3, 2023
    • Omron Corporation
    • Norihiro Tomago
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sensor device and measurement method
    • Patent number 11,506,787
    • Issue date Nov 22, 2022
    • Omron Corporation
    • Shoichi Ohnaka
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Displacement sensor
    • Patent number 11,294,057
    • Issue date Apr 5, 2022
    • Omron Corporation
    • Yusuke Iida
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    Periodic light projecting sensor control device and sensor system e...
    • Patent number 10,705,248
    • Issue date Jul 7, 2020
    • Omron Corporation
    • Takuya Matsushima
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Photosensor and sensor system
    • Patent number 10,416,346
    • Issue date Sep 17, 2019
    • Omron Corporation
    • Hironobu Morita
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sensor system having a plurality of coupled sensors
    • Patent number 9,291,497
    • Issue date Mar 22, 2016
    • Omron Corporation
    • Yusuke Iida
    • H04 - ELECTRIC COMMUNICATION TECHNIQUE
  • Information Patent Grant

    Photoelectric sensor
    • Patent number 8,947,652
    • Issue date Feb 3, 2015
    • Omron Corporation
    • Soji Ohmae
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Measurement apparatus
    • Patent number 8,917,900
    • Issue date Dec 23, 2014
    • Omron Corporation
    • Yoshihiro Kanetani
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Displacement sensor
    • Patent number 8,805,643
    • Issue date Aug 12, 2014
    • Omron Corporation
    • Hiroaki Takimasa
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Displacement sensor
    • Patent number 8,773,668
    • Issue date Jul 8, 2014
    • Omron Corporation
    • Yusuke Iida
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Image processing apparatus
    • Patent number 7,706,024
    • Issue date Apr 27, 2010
    • Omron Corporation
    • Mai Miyawaki
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    Displacement sensor
    • Patent number 7,663,759
    • Issue date Feb 16, 2010
    • Omron Corporation
    • Tokiko Inoue
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    Multiple sensor system
    • Patent number 7,333,912
    • Issue date Feb 19, 2008
    • Omron Corporation
    • Yusuke Iida
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Multiple sensor system
    • Patent number 7,305,321
    • Issue date Dec 4, 2007
    • Omron Corporation
    • Yusuke Iida
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Multiple sensor system
    • Patent number 7,092,842
    • Issue date Aug 15, 2006
    • Omron Corporation
    • Yusuke Iida
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Method of creating conversion table for distance detection and disp...
    • Patent number 6,819,100
    • Issue date Nov 16, 2004
    • Omron Corporation
    • Yusuke Iida
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    PHOTOELECTRIC SENSOR AND THRESHOLD SETTING METHOD
    • Publication number 20230057540
    • Publication date Feb 23, 2023
    • Omron Corporation
    • Kohei TANISUE
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR SYSTEM, MASTER UNIT, PREDICTION DEVICE, AND PREDICTION METHOD
    • Publication number 20220390925
    • Publication date Dec 8, 2022
    • Omron Corporation
    • Yusuke IIDA
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    SENSOR DEVICE AND DETECTION METHOD
    • Publication number 20210389458
    • Publication date Dec 16, 2021
    • Omron Corporation
    • Shoichi OHNAKA
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR SYSTEM
    • Publication number 20210018528
    • Publication date Jan 21, 2021
    • Omron Corporation
    • Norihiro TOMAGO
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR DEVICE AND MEASUREMENT METHOD
    • Publication number 20200209395
    • Publication date Jul 2, 2020
    • Omron Corporation
    • Shoichi OHNAKA
    • G01 - MEASURING TESTING
  • Information Patent Application

    DISPLACEMENT SENSOR
    • Publication number 20190129033
    • Publication date May 2, 2019
    • Omron Corporation
    • Yusuke IIDA
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    OPTICAL SENSOR AND DETECTION METHOD
    • Publication number 20190128732
    • Publication date May 2, 2019
    • Omron Corporation
    • Shintaro ANDO
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Application

    PHOTOSENSOR AND SENSOR SYSTEM
    • Publication number 20180267203
    • Publication date Sep 20, 2018
    • Omron Corporation
    • Hironobu MORITA
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR CONTROL DEVICE AND SENSOR SYSTEM
    • Publication number 20180224570
    • Publication date Aug 9, 2018
    • Omron Corporation
    • Takuya MATSUSHIMA
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR SYSTEM
    • Publication number 20140131555
    • Publication date May 15, 2014
    • Omron Corporation
    • Yusuke IIDA
    • G01 - MEASURING TESTING
  • Information Patent Application

    PHOTOELECTRIC SENSOR
    • Publication number 20140111814
    • Publication date Apr 24, 2014
    • Omron Corporation
    • Soji OHMAE
    • G01 - MEASURING TESTING
  • Information Patent Application

    DISPLACEMENT SENSOR
    • Publication number 20130201490
    • Publication date Aug 8, 2013
    • Yusuke Iida
    • G01 - MEASURING TESTING
  • Information Patent Application

    DISPLACEMENT SENSOR
    • Publication number 20120303317
    • Publication date Nov 29, 2012
    • Omron Corporation
    • Hiroaki TAKIMASA
    • G01 - MEASURING TESTING
  • Information Patent Application

    MEASUREMENT APPARATUS
    • Publication number 20100232650
    • Publication date Sep 16, 2010
    • OMRON CORPORATION
    • Yoshihiro KANETANI
    • G02 - OPTICS
  • Information Patent Application

    DISPLACEMENT SENSOR
    • Publication number 20080013103
    • Publication date Jan 17, 2008
    • OMRON CORPORATION
    • Tokiko INOUE
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    Image processing apparatus
    • Publication number 20070076277
    • Publication date Apr 5, 2007
    • OMRON CORPORATION
    • Mai Miyawaki
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    Multiple sensor system
    • Publication number 20060224353
    • Publication date Oct 5, 2006
    • OMRON CORPORATION
    • Yusuke Iida
    • G01 - MEASURING TESTING
  • Information Patent Application

    Multiple sensor system
    • Publication number 20060224354
    • Publication date Oct 5, 2006
    • OMRON CORPORATION
    • Yusuke Iida
    • G01 - MEASURING TESTING
  • Information Patent Application

    Multiple sensor system
    • Publication number 20050110000
    • Publication date May 26, 2005
    • OMRON CORPORATION
    • Yusuke Iida
    • G01 - MEASURING TESTING
  • Information Patent Application

    Method of creating conversion table for distance detection and disp...
    • Publication number 20040174158
    • Publication date Sep 9, 2004
    • OMRON CORPORATION
    • Yusuke Iida
    • G01 - MEASURING TESTING