Yusuke JIN

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Sapporo-shi, Hokkaido, JP

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Patents Grantslast 30 patents

Information Patent Grant
Subsampling device and method
- Patent number 10,101,245
- Issue date Oct 16, 2018
- National Institute of Advanced Industrial Science and Technology
- Yusuke Jin
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SUBSAMPLING DEVICE AND METHOD
- Publication number 20160299040
- Publication date Oct 13, 2016
- NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
- Yusuke JIN
- G01 - MEASURING TESTING