Yusuke KAGAYA

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method for sample preparation
- Patent number 8,008,635
- Issue date Aug 30, 2011
- Jeol, Ltd.
- Yusuke Kagaya
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Focused Ion Beam Apparatus
- Publication number 20240071718
- Publication date Feb 29, 2024
- JEOL Ltd.
- Yusuke Kagaya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and System for Sample Preparation
- Publication number 20090126051
- Publication date May 14, 2009
- JEOL Ltd.
- Yusuke KAGAYA
- G01 - MEASURING TESTING