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Yusuke Kinoshita
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Minowa, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Inertia measurement device, vehicle, and electronic device
Patent number
12,130,305
Issue date
Oct 29, 2024
Seiko Epson Corporation
Yusuke Kinoshita
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Inertia measurement device, vehicle, and electronic device
Patent number
11,860,185
Issue date
Jan 2, 2024
Seiko Epson Corporation
Yusuke Kinoshita
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Inertia measurement device, vehicle, and electronic device
Patent number
11,549,962
Issue date
Jan 10, 2023
Seiko Epson Corporation
Yusuke Kinoshita
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Inertia measurement device, vehicle, and electronic device
Patent number
11,231,442
Issue date
Jan 25, 2022
Seiko Epson Corporation
Yusuke Kinoshita
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Sensor unit, electronic apparatus, and moving body
Patent number
11,041,723
Issue date
Jun 22, 2021
Seiko Epson Corporation
Yusuke Kinoshita
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Inertia measurement device, vehicle, and electronic device
Patent number
10,976,342
Issue date
Apr 13, 2021
Seiko Epson Corporation
Yusuke Kinoshita
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Sensor unit, electronic apparatus, and moving body
Patent number
10,551,194
Issue date
Feb 4, 2020
Seiko Epson Corporation
Yusuke Kinoshita
G01 - MEASURING TESTING
Information
Patent Grant
Sensor unit having an adhesive member connected to an outer edge of...
Patent number
10,228,269
Issue date
Mar 12, 2019
Seiko Epson Corportion
Yoshikuni Saito
G01 - MEASURING TESTING
Information
Patent Grant
Sensor unit, electronic device, and moving body
Patent number
9,523,702
Issue date
Dec 20, 2016
Seiko Epson Corporation
Yusuke Kinoshita
G01 - MEASURING TESTING
Information
Patent Grant
Sensor unit, method of manufacturing the same, electronic apparatus...
Patent number
9,468,994
Issue date
Oct 18, 2016
Seiko Epson Corporation
Yusuke Kinoshita
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Method of manufacturing a piezoelectric device
Patent number
7,849,572
Issue date
Dec 14, 2010
Seiko Epson Corporation
Yusuke Kinoshita
G01 - MEASURING TESTING
Information
Patent Grant
Structures for supporting vibrators and devices for measuring physi...
Patent number
7,334,473
Issue date
Feb 26, 2008
NGK Insulators, Ltd.
Shigeki Hayashi
G01 - MEASURING TESTING
Information
Patent Grant
Structures for supporting vibrators and devices for measuring physi...
Patent number
7,278,313
Issue date
Oct 9, 2007
NGK Insulators, Ltd.
Shigeki Hayashi
G01 - MEASURING TESTING
Information
Patent Grant
Piezoelectric device
Patent number
7,157,836
Issue date
Jan 2, 2007
Seiko Epson Corporation
Yusuke Kinoshita
G01 - MEASURING TESTING
Information
Patent Grant
Piezoelectric device and method for manufacturing the same
Patent number
7,145,283
Issue date
Dec 5, 2006
Seiko Epson Corporation
Manabu Takeuchi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Piezoelectric device and method of manufacture of a piezoelectric d...
Patent number
7,091,651
Issue date
Aug 15, 2006
Seiko Epson Corporation
Yusuke Kinoshita
G01 - MEASURING TESTING
Information
Patent Grant
Surface acoustic wave device and method of manufacturing the same
Patent number
7,038,353
Issue date
May 2, 2006
Seiko Epson Corporation
Yoshio Maeda
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Supporting mechanism for a vibrator and a vibrator unit including a...
Patent number
7,000,472
Issue date
Feb 21, 2006
Seiko Epson Corporation
Yusuke Kinoshita
G01 - MEASURING TESTING
Information
Patent Grant
Surface acoustic wave device and manufacturing method thereof
Patent number
6,734,605
Issue date
May 11, 2004
Seiko Epson Corporation
Yusuke Kinoshita
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Inertia Measurement Device, Vehicle, And Electronic Device
Publication number
20240418744
Publication date
Dec 19, 2024
SEIKO EPSON CORPORATION
Yusuke KINOSHITA
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Inertia Measurement Device, Vehicle, And Electronic Device
Publication number
20240044936
Publication date
Feb 8, 2024
SEIKO EPSON CORPORATION
Yusuke KINOSHITA
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Inertia Measurement Device, Vehicle, And Electronic Device
Publication number
20230120267
Publication date
Apr 20, 2023
SEIKO EPSON CORPORATION
Yusuke KINOSHITA
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Inertia Measurement Device, Vehicle, And Electronic Device
Publication number
20220291251
Publication date
Sep 15, 2022
SEIKO EPSON CORPORATION
Yusuke KINOSHITA
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Inertia Measurement Device, Vehicle, And Electronic Device
Publication number
20210190817
Publication date
Jun 24, 2021
SEIKO EPSON CORPORATION
Yusuke KINOSHITA
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
SENSOR UNIT, ELECTRONIC APPARATUS, AND MOVING BODY
Publication number
20200132460
Publication date
Apr 30, 2020
SEIKO EPSON CORPORATION
Yusuke KINOSHITA
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
INERTIA MEASUREMENT DEVICE, VEHICLE, AND ELECTRONIC DEVICE
Publication number
20190277880
Publication date
Sep 12, 2019
SEIKO EPSON CORPORATION
Yusuke KINOSHITA
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
SENSOR UNIT, ELECTRONIC APPARATUS, AND MOVING BODY
Publication number
20170191832
Publication date
Jul 6, 2017
SEIKO EPSON CORPORATION
Yusuke KINOSHITA
G01 - MEASURING TESTING
Information
Patent Application
SENSOR UNIT, ELECTRONIC APPARATUS, AND MOVING OBJECT
Publication number
20170059605
Publication date
Mar 2, 2017
SEIKO EPSON CORPORATION
Yoshikuni SAITO
G01 - MEASURING TESTING
Information
Patent Application
SENSOR UNIT, ELECTRONIC APPARATUS, AND MOVING OBJECT
Publication number
20150040666
Publication date
Feb 12, 2015
SEIKO EPSON CORPORATION
Yoshikuni SAITO
G01 - MEASURING TESTING
Information
Patent Application
SENSOR UNIT, METHOD OF MANUFACTURING THE SAME, ELECTRONIC APPARATUS...
Publication number
20140347823
Publication date
Nov 27, 2014
SEIKO EPSON CORPORATION
Yusuke KINOSHITA
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
SENSOR UNIT, ELECTRONIC DEVICE, AND MOVING BODY
Publication number
20130327143
Publication date
Dec 12, 2013
Yusuke Kinoshita
G01 - MEASURING TESTING
Information
Patent Application
Piezoelectric device and method of manufacture of a piezoelectric d...
Publication number
20060272139
Publication date
Dec 7, 2006
SEIKO EPSON CORPORATION
Yusuke Kinoshita
G01 - MEASURING TESTING
Information
Patent Application
Structures for supporting vibrators and devices for measuring physi...
Publication number
20060053883
Publication date
Mar 16, 2006
NGK Insulators, Ltd.
Shigeki Hayashi
G01 - MEASURING TESTING
Information
Patent Application
Structures for supporting vibrators and devices for measuring physi...
Publication number
20060053884
Publication date
Mar 16, 2006
NGK Insulators, Ltd.
Shigeki Hayashi
G01 - MEASURING TESTING
Information
Patent Application
Supporting mechanism for a vibrator and a vibrator unit including a...
Publication number
20050262940
Publication date
Dec 1, 2005
Yusuke Kinoshita
G01 - MEASURING TESTING
Information
Patent Application
Piezoelectric device and method for manufacturing the same
Publication number
20040160145
Publication date
Aug 19, 2004
Manabu Takeuchi
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Surface acoustic wave device and its manufacturing method
Publication number
20030020367
Publication date
Jan 30, 2003
Yoshio Maeda
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Surface acoustic wave device and manufacturing method thereof
Publication number
20020135269
Publication date
Sep 26, 2002
SEIKO EPSON CORPORATION
Yusuke Kinoshita
H01 - BASIC ELECTRIC ELEMENTS